A study on signature analyzer for design for test (DFT)

This paper takes a look at the use of linear feedback shift registers (LFSR's) as test pattern generators (TPG's) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences...

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Bibliographic Details
Main Authors: A'ain, Abu Khari, Lim, C. T., Kok, Hong Ng, Sheng, Kwang Ng, Liew, Eng Yew
Format: Book Section
Language:English
Published: IEEE 2004
Subjects:
Online Access:http://eprints.utm.my/1888/1/AbuLimKok2004_StudyOnSignatureAnalyzerForDFT.pdf
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author A'ain, Abu Khari
Lim, C. T.
Kok, Hong Ng
Sheng, Kwang Ng
Liew, Eng Yew
author_facet A'ain, Abu Khari
Lim, C. T.
Kok, Hong Ng
Sheng, Kwang Ng
Liew, Eng Yew
author_sort A'ain, Abu Khari
collection ePrints
description This paper takes a look at the use of linear feedback shift registers (LFSR's) as test pattern generators (TPG's) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences of the same set of test patterns.
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spelling utm.eprints-18882011-03-03T06:47:52Z http://eprints.utm.my/1888/ A study on signature analyzer for design for test (DFT) A'ain, Abu Khari Lim, C. T. Kok, Hong Ng Sheng, Kwang Ng Liew, Eng Yew TK Electrical engineering. Electronics Nuclear engineering This paper takes a look at the use of linear feedback shift registers (LFSR's) as test pattern generators (TPG's) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences of the same set of test patterns. IEEE 2004-12-07 Book Section PeerReviewed application/pdf en http://eprints.utm.my/1888/1/AbuLimKok2004_StudyOnSignatureAnalyzerForDFT.pdf A'ain, Abu Khari and Lim, C. T. and Kok, Hong Ng and Sheng, Kwang Ng and Liew, Eng Yew (2004) A study on signature analyzer for design for test (DFT). In: Proceedings 2004 IEEE International Conference on Semiconductor Electronics. IEEE, USA, pp. 138-142. ISBN 0-7803-8658-2 10.1109/SMELEC.2004.1620855
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
A'ain, Abu Khari
Lim, C. T.
Kok, Hong Ng
Sheng, Kwang Ng
Liew, Eng Yew
A study on signature analyzer for design for test (DFT)
title A study on signature analyzer for design for test (DFT)
title_full A study on signature analyzer for design for test (DFT)
title_fullStr A study on signature analyzer for design for test (DFT)
title_full_unstemmed A study on signature analyzer for design for test (DFT)
title_short A study on signature analyzer for design for test (DFT)
title_sort study on signature analyzer for design for test dft
topic TK Electrical engineering. Electronics Nuclear engineering
url http://eprints.utm.my/1888/1/AbuLimKok2004_StudyOnSignatureAnalyzerForDFT.pdf
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