A study on signature analyzer for design for test (DFT)
This paper takes a look at the use of linear feedback shift registers (LFSR's) as test pattern generators (TPG's) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences...
| Main Authors: | , , , , |
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| Format: | Book Section |
| Language: | English |
| Published: |
IEEE
2004
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| Subjects: | |
| Online Access: | http://eprints.utm.my/1888/1/AbuLimKok2004_StudyOnSignatureAnalyzerForDFT.pdf |