An Investigation on ADC Testing Using Digital Modelling
This paper presents an analysis of test results of digital model approach on Analogue-to-digital converter (ADC). The approach is to inject primary input with arbitrary frequencies and periodical digital pulse. The output response is sampled and analysed in order to distinguish between GO or No-GO....
Main Authors: | , |
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Format: | Book Section |
Language: | English |
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IEEE
2004
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Online Access: | http://eprints.utm.my/1921/1/abu2004_AnInvestigationOnADCTestingUsingDigitalModelling.pdf |
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author | Leong, Mun Hon A'ain, Abu Khari |
author_facet | Leong, Mun Hon A'ain, Abu Khari |
author_sort | Leong, Mun Hon |
collection | ePrints |
description | This paper presents an analysis of test results of digital model approach on Analogue-to-digital converter (ADC). The approach is to inject primary input with arbitrary frequencies and periodical digital pulse. The output response is sampled and analysed in order to distinguish between GO or No-GO. Furthermore, the proposed technique is also coupled with power supply voltage control test
technique to investigate the fault coverage margin.
Histogram test, conventional industrial test technique, simulates concurrently were also employed as a comparison study. |
first_indexed | 2024-03-05T17:57:53Z |
format | Book Section |
id | utm.eprints-1921 |
institution | Universiti Teknologi Malaysia - ePrints |
language | English |
last_indexed | 2024-03-05T17:57:53Z |
publishDate | 2004 |
publisher | IEEE |
record_format | dspace |
spelling | utm.eprints-19212011-03-03T06:33:46Z http://eprints.utm.my/1921/ An Investigation on ADC Testing Using Digital Modelling Leong, Mun Hon A'ain, Abu Khari TK Electrical engineering. Electronics Nuclear engineering This paper presents an analysis of test results of digital model approach on Analogue-to-digital converter (ADC). The approach is to inject primary input with arbitrary frequencies and periodical digital pulse. The output response is sampled and analysed in order to distinguish between GO or No-GO. Furthermore, the proposed technique is also coupled with power supply voltage control test technique to investigate the fault coverage margin. Histogram test, conventional industrial test technique, simulates concurrently were also employed as a comparison study. IEEE 2004-12-21 Book Section PeerReviewed application/pdf en http://eprints.utm.my/1921/1/abu2004_AnInvestigationOnADCTestingUsingDigitalModelling.pdf Leong, Mun Hon and A'ain, Abu Khari (2004) An Investigation on ADC Testing Using Digital Modelling. In: Tencon 2004 - 2004 Ieee Region 10 Conference, Vols A-D, Proceedings - Analog And Digital Techniques In Electrical Engineering. TENCON-IEEE Region 10 Conference Proceedings , D . IEEE, USA, pp. 245-249. ISBN 0-7803-8560-8 10.1109/TENCON.2004.1414915 |
spellingShingle | TK Electrical engineering. Electronics Nuclear engineering Leong, Mun Hon A'ain, Abu Khari An Investigation on ADC Testing Using Digital Modelling |
title | An Investigation on ADC Testing Using Digital Modelling |
title_full | An Investigation on ADC Testing Using Digital Modelling |
title_fullStr | An Investigation on ADC Testing Using Digital Modelling |
title_full_unstemmed | An Investigation on ADC Testing Using Digital Modelling |
title_short | An Investigation on ADC Testing Using Digital Modelling |
title_sort | investigation on adc testing using digital modelling |
topic | TK Electrical engineering. Electronics Nuclear engineering |
url | http://eprints.utm.my/1921/1/abu2004_AnInvestigationOnADCTestingUsingDigitalModelling.pdf |
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