Simple analogue active filter testing using digital modelling

This paper presents a new approach to detect analogue catastrophic faults via digital modelling for an analogue filter. Area of interest in this paper is to prove that analogue circuit can be translated into logic gates (0's or 1's) and investigates the effectiveness of analogue fault (sho...

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Main Authors: Leong, Mun Hon, A'ain, Abu Khari
Format: Article
Language:English
Published: 2003
Subjects:
Online Access:http://eprints.utm.my/2052/1/Mun2003_SimpleAnalogueActiveFilterTesting.pdf
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author Leong, Mun Hon
A'ain, Abu Khari
author_facet Leong, Mun Hon
A'ain, Abu Khari
author_sort Leong, Mun Hon
collection ePrints
description This paper presents a new approach to detect analogue catastrophic faults via digital modelling for an analogue filter. Area of interest in this paper is to prove that analogue circuit can be translated into logic gates (0's or 1's) and investigates the effectiveness of analogue fault (short and open) in analogy approximate to digital stuck-at fault model. The purpose of testing fault that connects active component to supply terminal (stuck-at fault) is to investigate the characteristic of the output response, whether can successful model analogue fault to logic level. The approach is to sensitise primary input with an arbitrary frequency square-wave as stimuli and observes output signature in transient and frequency response in order to distinguish Go or No-GO. It is a simple method to accelerate production test without any extra circuitry. This approach has been implemented to a frequency-dependant circuit (Butterworth low pass filter) in order to verify its functionability.
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spelling utm.eprints-20522010-06-01T03:00:32Z http://eprints.utm.my/2052/ Simple analogue active filter testing using digital modelling Leong, Mun Hon A'ain, Abu Khari TK Electrical engineering. Electronics Nuclear engineering This paper presents a new approach to detect analogue catastrophic faults via digital modelling for an analogue filter. Area of interest in this paper is to prove that analogue circuit can be translated into logic gates (0's or 1's) and investigates the effectiveness of analogue fault (short and open) in analogy approximate to digital stuck-at fault model. The purpose of testing fault that connects active component to supply terminal (stuck-at fault) is to investigate the characteristic of the output response, whether can successful model analogue fault to logic level. The approach is to sensitise primary input with an arbitrary frequency square-wave as stimuli and observes output signature in transient and frequency response in order to distinguish Go or No-GO. It is a simple method to accelerate production test without any extra circuitry. This approach has been implemented to a frequency-dependant circuit (Butterworth low pass filter) in order to verify its functionability. 2003-08-25 Article PeerReviewed application/pdf en http://eprints.utm.my/2052/1/Mun2003_SimpleAnalogueActiveFilterTesting.pdf Leong, Mun Hon and A'ain, Abu Khari (2003) Simple analogue active filter testing using digital modelling. Student Conference on Research and Development (SCOReD) 2003 Proceedings, Putrajaya, Malaysia . pp. 197-201.
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Leong, Mun Hon
A'ain, Abu Khari
Simple analogue active filter testing using digital modelling
title Simple analogue active filter testing using digital modelling
title_full Simple analogue active filter testing using digital modelling
title_fullStr Simple analogue active filter testing using digital modelling
title_full_unstemmed Simple analogue active filter testing using digital modelling
title_short Simple analogue active filter testing using digital modelling
title_sort simple analogue active filter testing using digital modelling
topic TK Electrical engineering. Electronics Nuclear engineering
url http://eprints.utm.my/2052/1/Mun2003_SimpleAnalogueActiveFilterTesting.pdf
work_keys_str_mv AT leongmunhon simpleanalogueactivefiltertestingusingdigitalmodelling
AT aainabukhari simpleanalogueactivefiltertestingusingdigitalmodelling