Neural network paradigm for classification of defects on PCB

A new technique is proposed to classify the defects that could occur on the PCB using neural network paradigm. The algorithms to segment the image into basic primitive patterns, enclosing the primitive patterns, patterns assignment, patterns normalization, and classification have been developed base...

Full description

Bibliographic Details
Main Authors: Heriansyah, Rudi, Syed Al-Attas, Syed Abdul Rahman, Zabidi, Muhammad Mun'im Ahmad
Format: Article
Language:English
Published: Penerbit UTM Press 2003
Subjects:
Online Access:http://eprints.utm.my/2086/1/JTMKK39%28D%29bab9.pdf
_version_ 1825909180084518912
author Heriansyah, Rudi
Syed Al-Attas, Syed Abdul Rahman
Zabidi, Muhammad Mun'im Ahmad
author_facet Heriansyah, Rudi
Syed Al-Attas, Syed Abdul Rahman
Zabidi, Muhammad Mun'im Ahmad
author_sort Heriansyah, Rudi
collection ePrints
description A new technique is proposed to classify the defects that could occur on the PCB using neural network paradigm. The algorithms to segment the image into basic primitive patterns, enclosing the primitive patterns, patterns assignment, patterns normalization, and classification have been developed based on binary morphological image processing and Learning Vector Quantization (LVQ) neural network. Thousands of defective patterns have been used for training, and the neural network is tested for evaluating its performance. A defective PCB image is used to ensure the function of the proposed technique.
first_indexed 2024-03-05T17:58:19Z
format Article
id utm.eprints-2086
institution Universiti Teknologi Malaysia - ePrints
language English
last_indexed 2024-03-05T17:58:19Z
publishDate 2003
publisher Penerbit UTM Press
record_format dspace
spelling utm.eprints-20862017-11-01T04:17:39Z http://eprints.utm.my/2086/ Neural network paradigm for classification of defects on PCB Heriansyah, Rudi Syed Al-Attas, Syed Abdul Rahman Zabidi, Muhammad Mun'im Ahmad TK Electrical engineering. Electronics Nuclear engineering A new technique is proposed to classify the defects that could occur on the PCB using neural network paradigm. The algorithms to segment the image into basic primitive patterns, enclosing the primitive patterns, patterns assignment, patterns normalization, and classification have been developed based on binary morphological image processing and Learning Vector Quantization (LVQ) neural network. Thousands of defective patterns have been used for training, and the neural network is tested for evaluating its performance. A defective PCB image is used to ensure the function of the proposed technique. Penerbit UTM Press 2003-12 Article PeerReviewed application/pdf en http://eprints.utm.my/2086/1/JTMKK39%28D%29bab9.pdf Heriansyah, Rudi and Syed Al-Attas, Syed Abdul Rahman and Zabidi, Muhammad Mun'im Ahmad (2003) Neural network paradigm for classification of defects on PCB. Jurnal Teknologi D (39D). pp. 87-104. ISSN 0127-9696
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Heriansyah, Rudi
Syed Al-Attas, Syed Abdul Rahman
Zabidi, Muhammad Mun'im Ahmad
Neural network paradigm for classification of defects on PCB
title Neural network paradigm for classification of defects on PCB
title_full Neural network paradigm for classification of defects on PCB
title_fullStr Neural network paradigm for classification of defects on PCB
title_full_unstemmed Neural network paradigm for classification of defects on PCB
title_short Neural network paradigm for classification of defects on PCB
title_sort neural network paradigm for classification of defects on pcb
topic TK Electrical engineering. Electronics Nuclear engineering
url http://eprints.utm.my/2086/1/JTMKK39%28D%29bab9.pdf
work_keys_str_mv AT heriansyahrudi neuralnetworkparadigmforclassificationofdefectsonpcb
AT syedalattassyedabdulrahman neuralnetworkparadigmforclassificationofdefectsonpcb
AT zabidimuhammadmunimahmad neuralnetworkparadigmforclassificationofdefectsonpcb