Neural network paradigm for classification of defects on PCB

A new technique is proposed to classify the defects that could occur on the PCB using neural network paradigm. The algorithms to segment the image into basic primitive patterns, enclosing the primitive patterns, patterns assignment, patterns normalization, and classification have been developed base...

Täydet tiedot

Bibliografiset tiedot
Päätekijät: Heriansyah, Rudi, Syed Al-Attas, Syed Abdul Rahman, Zabidi, Muhammad Mun'im Ahmad
Aineistotyyppi: Artikkeli
Kieli:English
Julkaistu: Penerbit UTM Press 2003
Aiheet:
Linkit:http://eprints.utm.my/2086/1/JTMKK39%28D%29bab9.pdf