A new class of easily testable assignment decision diagrams
This paper introduces a new class of assignment decision diagrams (ADD) called thru-testable ADDs based on a testability property called thru function. The thru-testable ADDs is an easily-testable set of thru functions that allows data transfer from its input to its output. We also define a design-f...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Published: |
University of Malaya
2010
|
| Subjects: |
| _version_ | 1796855954947440640 |
|---|---|
| author | Paraman, Norlina Ooi, Chia Yee Sha'ameri, Ahmad Zuri Fujiwara, Hideo |
| author_facet | Paraman, Norlina Ooi, Chia Yee Sha'ameri, Ahmad Zuri Fujiwara, Hideo |
| author_sort | Paraman, Norlina |
| collection | ePrints |
| description | This paper introduces a new class of assignment decision diagrams (ADD) called thru-testable ADDs based on a testability property called thru function. The thru-testable ADDs is an easily-testable set of thru functions that allows data transfer from its input to its output. We also define a design-for-testability (DFT) method to augment a given ADD with thru functions so that the ADD becomes thru-testable. We compare the circuits modified using our proposed method with the original circuits and partial scan designed circuits in terms of fault efficiency, area overhead, test generation time and test application time. Since the proposed DFT method is introduced at a high level, which deals with less number of gates, the information of thru functions can be extracted more easily. As a result, it lowers the area overhead compared to partial scan. |
| first_indexed | 2024-03-05T18:36:15Z |
| format | Article |
| id | utm.eprints-22805 |
| institution | Universiti Teknologi Malaysia - ePrints |
| last_indexed | 2024-03-05T18:36:15Z |
| publishDate | 2010 |
| publisher | University of Malaya |
| record_format | dspace |
| spelling | utm.eprints-228052018-03-22T08:34:46Z http://eprints.utm.my/22805/ A new class of easily testable assignment decision diagrams Paraman, Norlina Ooi, Chia Yee Sha'ameri, Ahmad Zuri Fujiwara, Hideo QA75 Electronic computers. Computer science This paper introduces a new class of assignment decision diagrams (ADD) called thru-testable ADDs based on a testability property called thru function. The thru-testable ADDs is an easily-testable set of thru functions that allows data transfer from its input to its output. We also define a design-for-testability (DFT) method to augment a given ADD with thru functions so that the ADD becomes thru-testable. We compare the circuits modified using our proposed method with the original circuits and partial scan designed circuits in terms of fault efficiency, area overhead, test generation time and test application time. Since the proposed DFT method is introduced at a high level, which deals with less number of gates, the information of thru functions can be extracted more easily. As a result, it lowers the area overhead compared to partial scan. University of Malaya 2010 Article PeerReviewed Paraman, Norlina and Ooi, Chia Yee and Sha'ameri, Ahmad Zuri and Fujiwara, Hideo (2010) A new class of easily testable assignment decision diagrams. Malaysian Journal of Computer Science, 23 (1). 1 - 17. ISSN 0127-9084 http://ejum.fsktm.um.edu.my/ArticleInformation.aspx?ArticleID=874 |
| spellingShingle | QA75 Electronic computers. Computer science Paraman, Norlina Ooi, Chia Yee Sha'ameri, Ahmad Zuri Fujiwara, Hideo A new class of easily testable assignment decision diagrams |
| title | A new class of easily testable assignment decision diagrams |
| title_full | A new class of easily testable assignment decision diagrams |
| title_fullStr | A new class of easily testable assignment decision diagrams |
| title_full_unstemmed | A new class of easily testable assignment decision diagrams |
| title_short | A new class of easily testable assignment decision diagrams |
| title_sort | new class of easily testable assignment decision diagrams |
| topic | QA75 Electronic computers. Computer science |
| work_keys_str_mv | AT paramannorlina anewclassofeasilytestableassignmentdecisiondiagrams AT ooichiayee anewclassofeasilytestableassignmentdecisiondiagrams AT shaameriahmadzuri anewclassofeasilytestableassignmentdecisiondiagrams AT fujiwarahideo anewclassofeasilytestableassignmentdecisiondiagrams AT paramannorlina newclassofeasilytestableassignmentdecisiondiagrams AT ooichiayee newclassofeasilytestableassignmentdecisiondiagrams AT shaameriahmadzuri newclassofeasilytestableassignmentdecisiondiagrams AT fujiwarahideo newclassofeasilytestableassignmentdecisiondiagrams |