Modified pattern generator of built-in self test for sequential circuits with reduced test time
| Main Author: | |
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| Format: | Thesis |
| Published: |
2011
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| Subjects: |
| _version_ | 1796856313897025536 |
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| author | Muhamad Amin, Muhamad Ridzuan Radin |
| author_facet | Muhamad Amin, Muhamad Ridzuan Radin |
| author_sort | Muhamad Amin, Muhamad Ridzuan Radin |
| collection | ePrints |
| first_indexed | 2024-03-05T18:41:05Z |
| format | Thesis |
| id | utm.eprints-26858 |
| institution | Universiti Teknologi Malaysia - ePrints |
| last_indexed | 2024-03-05T18:41:05Z |
| publishDate | 2011 |
| record_format | dspace |
| spelling | utm.eprints-268582017-07-10T07:19:55Z http://eprints.utm.my/26858/ Modified pattern generator of built-in self test for sequential circuits with reduced test time Muhamad Amin, Muhamad Ridzuan Radin TK Electrical engineering. Electronics Nuclear engineering 2011 Thesis NonPeerReviewed Muhamad Amin, Muhamad Ridzuan Radin (2011) Modified pattern generator of built-in self test for sequential circuits with reduced test time. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering. http://libraryopac.utm.my/client/en_AU/main/search/results?qu=Modified+pattern+generator+of+built-in+self+test+for+sequential+circuits+with+reduced+test+time&te= |
| spellingShingle | TK Electrical engineering. Electronics Nuclear engineering Muhamad Amin, Muhamad Ridzuan Radin Modified pattern generator of built-in self test for sequential circuits with reduced test time |
| title | Modified pattern generator of built-in self test for sequential circuits with reduced test time |
| title_full | Modified pattern generator of built-in self test for sequential circuits with reduced test time |
| title_fullStr | Modified pattern generator of built-in self test for sequential circuits with reduced test time |
| title_full_unstemmed | Modified pattern generator of built-in self test for sequential circuits with reduced test time |
| title_short | Modified pattern generator of built-in self test for sequential circuits with reduced test time |
| title_sort | modified pattern generator of built in self test for sequential circuits with reduced test time |
| topic | TK Electrical engineering. Electronics Nuclear engineering |
| work_keys_str_mv | AT muhamadaminmuhamadridzuanradin modifiedpatterngeneratorofbuiltinselftestforsequentialcircuitswithreducedtesttime |