Thermal stress effect in diode end-pumped Nd:YVO4 bar laser

The thermal stress effect on various doping levels of yttrium vanadate crystal Nd:YVO4 is investigated. Diode end-pumped source was used to obtain the input-output characteristics of the vanadate crystal. The laser performance of the low doping crystal is poor since the optical conversion efficiency...

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Main Authors: Bidin, Noriah, Krishnan, Ganesan, Khamsan, Nur Ezaan, Zainal, Roslinda, Bakhtiar, Hazri
Format: Book Section
Published: American Institute of Physics 2012
Subjects:
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author Bidin, Noriah
Krishnan, Ganesan
Khamsan, Nur Ezaan
Zainal, Roslinda
Bakhtiar, Hazri
author_facet Bidin, Noriah
Krishnan, Ganesan
Khamsan, Nur Ezaan
Zainal, Roslinda
Bakhtiar, Hazri
author_sort Bidin, Noriah
collection ePrints
description The thermal stress effect on various doping levels of yttrium vanadate crystal Nd:YVO4 is investigated. Diode end-pumped source was used to obtain the input-output characteristics of the vanadate crystal. The laser performance of the low doping crystal is poor since the optical conversion efficiency is small and high threshold pump power. However the low Dopant crystal is not associated with thermal stress thus no thermal damage. Differently with higher concentration of Nd ions crystal, the laser performance is relatively high but it is accompanied with thermal damage which comprised of microcrack, microfracture and contamination. The high absorption on the doping ions with additional external impurities causes extra heat generation which leads to thermal fracture.
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publisher American Institute of Physics
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spelling utm.eprints-360532017-02-02T05:19:03Z http://eprints.utm.my/36053/ Thermal stress effect in diode end-pumped Nd:YVO4 bar laser Bidin, Noriah Krishnan, Ganesan Khamsan, Nur Ezaan Zainal, Roslinda Bakhtiar, Hazri Q Science The thermal stress effect on various doping levels of yttrium vanadate crystal Nd:YVO4 is investigated. Diode end-pumped source was used to obtain the input-output characteristics of the vanadate crystal. The laser performance of the low doping crystal is poor since the optical conversion efficiency is small and high threshold pump power. However the low Dopant crystal is not associated with thermal stress thus no thermal damage. Differently with higher concentration of Nd ions crystal, the laser performance is relatively high but it is accompanied with thermal damage which comprised of microcrack, microfracture and contamination. The high absorption on the doping ions with additional external impurities causes extra heat generation which leads to thermal fracture. American Institute of Physics 2012 Book Section PeerReviewed Bidin, Noriah and Krishnan, Ganesan and Khamsan, Nur Ezaan and Zainal, Roslinda and Bakhtiar, Hazri (2012) Thermal stress effect in diode end-pumped Nd:YVO4 bar laser. In: AIP Conference Proceedings. American Institute of Physics, Zurich, Switzerland, pp. 191-194. ISBN 978-073541056-5 http://dx.doi.org/10.1063/1.4732491 DOI:10.1063/1.4732491
spellingShingle Q Science
Bidin, Noriah
Krishnan, Ganesan
Khamsan, Nur Ezaan
Zainal, Roslinda
Bakhtiar, Hazri
Thermal stress effect in diode end-pumped Nd:YVO4 bar laser
title Thermal stress effect in diode end-pumped Nd:YVO4 bar laser
title_full Thermal stress effect in diode end-pumped Nd:YVO4 bar laser
title_fullStr Thermal stress effect in diode end-pumped Nd:YVO4 bar laser
title_full_unstemmed Thermal stress effect in diode end-pumped Nd:YVO4 bar laser
title_short Thermal stress effect in diode end-pumped Nd:YVO4 bar laser
title_sort thermal stress effect in diode end pumped nd yvo4 bar laser
topic Q Science
work_keys_str_mv AT bidinnoriah thermalstresseffectindiodeendpumpedndyvo4barlaser
AT krishnanganesan thermalstresseffectindiodeendpumpedndyvo4barlaser
AT khamsannurezaan thermalstresseffectindiodeendpumpedndyvo4barlaser
AT zainalroslinda thermalstresseffectindiodeendpumpedndyvo4barlaser
AT bakhtiarhazri thermalstresseffectindiodeendpumpedndyvo4barlaser