Modeling the effect of velocity saturation in nanoscale MOSFET
MOSFET scaling throughout the years has enabled us to pack million of MOS transistors on a single chip to keep in pace with Moore’s Law. The introduction of 65 nm and 90 nm process technology offer low power, high-density and highspeed generation of processor with latest technological advancement....
Main Author: | Tan, Michael Loong Peng |
---|---|
Format: | Thesis |
Language: | English |
Published: |
2006
|
Subjects: | |
Online Access: | http://eprints.utm.my/4593/1/MichaelTanLoongPengMFKE2006.pdf |
Similar Items
-
Modelling of nanoscale MOSFET performance in the velocity saturation region
by: Tan, Micheal Loong Peng, et al.
Published: (2007) -
Modeling the effect of velocity saturation in nanoscale mosfet /
by: 560362 Tan, Michael Loong Peng
Published: (2006) -
Invited paper: modeling of nanoscale MOSFET using MATLAB
by: Arora, Vijay K.
Published: (2009) -
Investigation on the effects of halo implants for nanoscale vertical MOSFET
by: Ismail, Razali, et al.
Published: (2007) -
Ballistic mobility and saturation velocity in low-dimensional nanostructures
by: Saad, Ismail, et al.
Published: (2009)