Fundamental sensor development in electrical resistance tomography

Fundamental sensor development in electrical resistance tomography

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This paper will provide a fundamental understanding of one of the most commonly used tomography, Electrical Resistance Tomography (ERT). Unlike the other tomography systems, ERT displayed conductivity distribution in the Region of Interest (ROI) and commonly associated to Sensitivity Theorem in thei...

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Bibliographic Details
Main Authors: Ling, En Hong, Abdul Rahim, Ruzairi, Ahmad, Anita, Md. Yunus, Mohd. Amri, Aba, Khairul Hamimah, Leow, Leow Pei, Wahid, Herman, Ahmad, Nasarudin, Abd. Shaib, Mohd. Fadzli, Abdul Wahab, Yasmin, Aw, Suzanna Ridzuan, Rahiman, Hafiz Fazalul, Zakaria, Zulkarnay
Format: Article
Language:English
Published: Penerbit UTM Press 2015
Subjects:
TK Electrical engineering. Electronics Nuclear engineering
Online Access:http://eprints.utm.my/55417/1/RuzairiAbdulRahim2015_FundamentalSensorDevelopmentinElectricalResistance.pdf

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