Fundamental sensor development in electrical resistance tomography

This paper will provide a fundamental understanding of one of the most commonly used tomography, Electrical Resistance Tomography (ERT). Unlike the other tomography systems, ERT displayed conductivity distribution in the Region of Interest (ROI) and commonly associated to Sensitivity Theorem in thei...

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Bibliographic Details
Main Authors:	Ling, En Hong, Abdul Rahim, Ruzairi, Ahmad, Anita, Md. Yunus, Mohd. Amri, Aba, Khairul Hamimah, Leow, Leow Pei, Wahid, Herman, Ahmad, Nasarudin, Abd. Shaib, Mohd. Fadzli, Abdul Wahab, Yasmin, Aw, Suzanna Ridzuan, Rahiman, Hafiz Fazalul, Zakaria, Zulkarnay
Format:	Article
Language:	English
Published:	Penerbit UTM Press 2015
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.utm.my/55417/1/RuzairiAbdulRahim2015_FundamentalSensorDevelopmentinElectricalResistance.pdf

Fundamental Sensor Development in Electrical Resistance Tomography by Ling, En Hong, Ruzairi, Abdul Rahim, Anita, Ahmad, Mohd Amri, Md. Yunus, Khairul, Hamimah Aba, Leow, Pei Ling, Herman, Wahid, Nasarudin, Ahmad, Mohd Fadzli, Abd Shaib, Yasmin, Abdul Wahab, Suzanna, Ridzuan Aw, Mohd Hafiz, Fazalul Rahiman, Zulkarnay, Zakaria

Published 2015

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Fundamental sensor development in electrical resistance tomography

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