Device design consideration for nanoscale MOSFET using semiconductor TCAD tools

The evolution of metal-oxide-semiconductor field effect transistor (MOSFET) technology has been governed mainly by device scaling over the past twenty years. One of the key questions concerning future ULSI technology is whether MOSFET devices can be scaled to 100 nmchannel length and beyond for cont...

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Detaylı Bibliyografya
Asıl Yazarlar: Teoh, Chin Hong, Ismail, Razali
Materyal Türü: Conference or Workshop Item
Dil:English
Baskı/Yayın Bilgisi: 2006
Konular:
Online Erişim:http://eprints.utm.my/7496/1/Razali_Ismail_2006_Device_Design_Consideration_for_Nanoscale.pdf

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