Ballistic quantum transport in a nanoscale metal-oxide-semiconductor field effect transistor

The ballistic saturation velocity in a nanoscale metal-oxide-semiconductor field effect transistor (MOSFET) is revealed to be limited to the Fermi velocity in a degenerately induced channel appropriate for the quasi-two-dimensional nature of the inverted channel. The saturation point drain velocity...

Full description

Bibliographic Details
Main Authors: Arora, Vijay K., Tan, Michael L. P., Saad, Ismail, Ismail, Razali
Format: Article
Published: American Institute of Physics 2007
Subjects:

Similar Items