Thermomigration in lead-free solder joints
In the next generation nanoelectronics and SiC based electronic packaging, current density and temperature gradient will be larger in orders of magnitude. Electromigration and thermomigration are considered to be major road blocks leading to realisation of nanoelectronics and SiC based high tempera...
Main Authors: | Abdul Hamid, M. F, S., Li, Basaran, C. |
---|---|
Format: | Article |
Published: |
Inderscience Publishers
2008
|
Subjects: |
Similar Items
-
Thermomigration induced degradation in solder alloys
by: Basaran, C., et al.
Published: (2008) -
Simulating damage mechanics of electromigration and thermomigration
by: Shidong, Li, et al.
Published: (2008) -
Optimization On Laser Soldering Parameters Onto Lead-Free Solder Joint
by: T. J., Nabila, et al.
Published: (2017) -
Effect of Cobalt Doping on the Microstructure and Tensile Properties of Lead Free Solder Joint Subjected to Electromigration
by: Bashir, M.N., et al.
Published: (2016) -
Influence of high-power-low-frequency ultrasonic vibration time on the microstructure and mechanical properties of lead-free solder joints
by: Tan, A.T., et al.
Published: (2016)