Effect of sm on yig: structural and dielectric properties evaluation
This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y 3-x Sm x Fe 5 O 12 (Sm x ; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary pha...
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| Format: | Conference or Workshop Item |
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2019
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| _version_ | 1796864696376098816 |
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| author | Ahmad, H. H. Rejab, N. A. Ahmad, Z. A. Ain, M. F. Othman, M. Ali, W. F. F. W. |
| author_facet | Ahmad, H. H. Rejab, N. A. Ahmad, Z. A. Ain, M. F. Othman, M. Ali, W. F. F. W. |
| author_sort | Ahmad, H. H. |
| collection | ePrints |
| description | This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y 3-x Sm x Fe 5 O 12 (Sm x ; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary phases such as YIP/SIP, hematite and yttria were detected. The presence of Sm also has a significant effect on the YIG's grain size (range 3.798μm - 7.131μm). For dielectric properties of doped YIG measured from 1GHz-20GHz has enhanced the dielectric constant (ϵr) from 15.4 to 17.5. |
| first_indexed | 2024-03-05T20:45:43Z |
| format | Conference or Workshop Item |
| id | utm.eprints-88770 |
| institution | Universiti Teknologi Malaysia - ePrints |
| last_indexed | 2024-03-05T20:45:43Z |
| publishDate | 2019 |
| record_format | dspace |
| spelling | utm.eprints-887702020-12-29T04:19:08Z http://eprints.utm.my/88770/ Effect of sm on yig: structural and dielectric properties evaluation Ahmad, H. H. Rejab, N. A. Ahmad, Z. A. Ain, M. F. Othman, M. Ali, W. F. F. W. TJ Mechanical engineering and machinery This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y 3-x Sm x Fe 5 O 12 (Sm x ; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary phases such as YIP/SIP, hematite and yttria were detected. The presence of Sm also has a significant effect on the YIG's grain size (range 3.798μm - 7.131μm). For dielectric properties of doped YIG measured from 1GHz-20GHz has enhanced the dielectric constant (ϵr) from 15.4 to 17.5. 2019 Conference or Workshop Item PeerReviewed Ahmad, H. H. and Rejab, N. A. and Ahmad, Z. A. and Ain, M. F. and Othman, M. and Ali, W. F. F. W. (2019) Effect of sm on yig: structural and dielectric properties evaluation. In: International Conference on X-Rays and Related Techniques in Research and Industry 2018, ICXRI 2018, 18-19 Aug 2018, Grand Riverview Hotel Kota Bharu, Kelantan, Malaysia. https://dx.doi.org/10.1063/1.5089411 |
| spellingShingle | TJ Mechanical engineering and machinery Ahmad, H. H. Rejab, N. A. Ahmad, Z. A. Ain, M. F. Othman, M. Ali, W. F. F. W. Effect of sm on yig: structural and dielectric properties evaluation |
| title | Effect of sm on yig: structural and dielectric properties evaluation |
| title_full | Effect of sm on yig: structural and dielectric properties evaluation |
| title_fullStr | Effect of sm on yig: structural and dielectric properties evaluation |
| title_full_unstemmed | Effect of sm on yig: structural and dielectric properties evaluation |
| title_short | Effect of sm on yig: structural and dielectric properties evaluation |
| title_sort | effect of sm on yig structural and dielectric properties evaluation |
| topic | TJ Mechanical engineering and machinery |
| work_keys_str_mv | AT ahmadhh effectofsmonyigstructuralanddielectricpropertiesevaluation AT rejabna effectofsmonyigstructuralanddielectricpropertiesevaluation AT ahmadza effectofsmonyigstructuralanddielectricpropertiesevaluation AT ainmf effectofsmonyigstructuralanddielectricpropertiesevaluation AT othmanm effectofsmonyigstructuralanddielectricpropertiesevaluation AT aliwffw effectofsmonyigstructuralanddielectricpropertiesevaluation |