Electrical potential study of single and segmented excitation for planar electrical capacitance tomography
Electrical Capacitance Tomography (ECT) is an imaging modality that can produce image reconstruction for the closed region, by measuring the permittivity value in the inspected area. This paper investigates numerically the characteristics of planar ECT configuration with single and segmented excitat...
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2019
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author | Mohammad Din, S. Leow, P. L. Hor, X. F. Pusppanathan, J. Zulkifli, N. A. Abdul Rahim, R. |
author_facet | Mohammad Din, S. Leow, P. L. Hor, X. F. Pusppanathan, J. Zulkifli, N. A. Abdul Rahim, R. |
author_sort | Mohammad Din, S. |
collection | ePrints |
description | Electrical Capacitance Tomography (ECT) is an imaging modality that can produce image reconstruction for the closed region, by measuring the permittivity value in the inspected area. This paper investigates numerically the characteristics of planar ECT configuration with single and segmented excitation. Simulations analysis were carried out using 8-electrode ECT system. The copper electrodes are fabricated at the bottom of the chamber. The planar model has a risk of detection where the sensitivity of the electrical field becomes weaker for areas away from the electrode, and for planar configuration it involves the upper area of the chamber. Simulation study is conducted by comparing different type excitation; single and segmented excitation (Protocols 1 and 2). Three points of voltage values in the upper area of the chamber are extracted for electric field strength study. Comparison in terms of image of excitation and also the difference in voltage value is taken into account, and from the analysis carried out, Protocol 2 provides a better electrical potential value than Protocol 1 with an average difference of 0.63V. Observation also found that if the electrode is excite near the wall chamber, there is a higher concentration of electrical potential in the chamber edge area. |
first_indexed | 2024-03-05T20:57:49Z |
format | Conference or Workshop Item |
id | utm.eprints-92779 |
institution | Universiti Teknologi Malaysia - ePrints |
last_indexed | 2024-03-05T20:57:49Z |
publishDate | 2019 |
record_format | dspace |
spelling | utm.eprints-927792021-10-28T10:10:06Z http://eprints.utm.my/92779/ Electrical potential study of single and segmented excitation for planar electrical capacitance tomography Mohammad Din, S. Leow, P. L. Hor, X. F. Pusppanathan, J. Zulkifli, N. A. Abdul Rahim, R. TK Electrical engineering. Electronics Nuclear engineering Electrical Capacitance Tomography (ECT) is an imaging modality that can produce image reconstruction for the closed region, by measuring the permittivity value in the inspected area. This paper investigates numerically the characteristics of planar ECT configuration with single and segmented excitation. Simulations analysis were carried out using 8-electrode ECT system. The copper electrodes are fabricated at the bottom of the chamber. The planar model has a risk of detection where the sensitivity of the electrical field becomes weaker for areas away from the electrode, and for planar configuration it involves the upper area of the chamber. Simulation study is conducted by comparing different type excitation; single and segmented excitation (Protocols 1 and 2). Three points of voltage values in the upper area of the chamber are extracted for electric field strength study. Comparison in terms of image of excitation and also the difference in voltage value is taken into account, and from the analysis carried out, Protocol 2 provides a better electrical potential value than Protocol 1 with an average difference of 0.63V. Observation also found that if the electrode is excite near the wall chamber, there is a higher concentration of electrical potential in the chamber edge area. 2019 Conference or Workshop Item PeerReviewed Mohammad Din, S. and Leow, P. L. and Hor, X. F. and Pusppanathan, J. and Zulkifli, N. A. and Abdul Rahim, R. (2019) Electrical potential study of single and segmented excitation for planar electrical capacitance tomography. In: 9th IEEE International Conference on System Engineering and Technology, ICSET 2019, 7 Okt 2019, Shah Alam, Selangor, Malaysia. http://dx.doi.org/10.1109/ICSEngT.2019.8906414 |
spellingShingle | TK Electrical engineering. Electronics Nuclear engineering Mohammad Din, S. Leow, P. L. Hor, X. F. Pusppanathan, J. Zulkifli, N. A. Abdul Rahim, R. Electrical potential study of single and segmented excitation for planar electrical capacitance tomography |
title | Electrical potential study of single and segmented excitation for planar electrical capacitance tomography |
title_full | Electrical potential study of single and segmented excitation for planar electrical capacitance tomography |
title_fullStr | Electrical potential study of single and segmented excitation for planar electrical capacitance tomography |
title_full_unstemmed | Electrical potential study of single and segmented excitation for planar electrical capacitance tomography |
title_short | Electrical potential study of single and segmented excitation for planar electrical capacitance tomography |
title_sort | electrical potential study of single and segmented excitation for planar electrical capacitance tomography |
topic | TK Electrical engineering. Electronics Nuclear engineering |
work_keys_str_mv | AT mohammaddins electricalpotentialstudyofsingleandsegmentedexcitationforplanarelectricalcapacitancetomography AT leowpl electricalpotentialstudyofsingleandsegmentedexcitationforplanarelectricalcapacitancetomography AT horxf electricalpotentialstudyofsingleandsegmentedexcitationforplanarelectricalcapacitancetomography AT pusppanathanj electricalpotentialstudyofsingleandsegmentedexcitationforplanarelectricalcapacitancetomography AT zulkiflina electricalpotentialstudyofsingleandsegmentedexcitationforplanarelectricalcapacitancetomography AT abdulrahimr electricalpotentialstudyofsingleandsegmentedexcitationforplanarelectricalcapacitancetomography |