Compact multiport reflectometer for microwave material characterization
In this project, a simple, innovative, and compact three-probe reflectometer has been developed. The reflectometer can be used to find the complex reflection coefficient of an unknown device under test over a relatively broad frequency range based on the three measured power amplitudes of the three...
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| Format: | Thesis |
| Language: | English |
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2020
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| Online Access: | http://eprints.utm.my/93004/1/ObaidallahIbrahimMSKE2020.pdf |
| _version_ | 1796865536262406144 |
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| author | Mohamed Elshafiey, Obaidallah Ibrahim |
| author_facet | Mohamed Elshafiey, Obaidallah Ibrahim |
| author_sort | Mohamed Elshafiey, Obaidallah Ibrahim |
| collection | ePrints |
| description | In this project, a simple, innovative, and compact three-probe reflectometer has been developed. The reflectometer can be used to find the complex reflection coefficient of an unknown device under test over a relatively broad frequency range based on the three measured power amplitudes of the three probes. The designed three-probe reflectometer is expected to provide results comparable to those provided by a commercial vector network analyser. Besides simple, the main advantage of this threeprobe reflectometer is that it only involves scalar amplitude measurements and no phase-shift measurements, whereby it has less electronic circuit component requirements and reduces the cost of the electronic components, as well as it is insensitive to the operating temperature. The main contribution of this work is that the operating bandwidth of the reflectometer has been improved by optimizing the distance or space position between the three probes along the transmission line. Besides that, a calibration process was designed to eliminate systematic errors of reflectometer. |
| first_indexed | 2024-03-05T20:58:30Z |
| format | Thesis |
| id | utm.eprints-93004 |
| institution | Universiti Teknologi Malaysia - ePrints |
| language | English |
| last_indexed | 2024-03-05T20:58:30Z |
| publishDate | 2020 |
| record_format | dspace |
| spelling | utm.eprints-930042021-11-07T06:00:21Z http://eprints.utm.my/93004/ Compact multiport reflectometer for microwave material characterization Mohamed Elshafiey, Obaidallah Ibrahim TK Electrical engineering. Electronics Nuclear engineering In this project, a simple, innovative, and compact three-probe reflectometer has been developed. The reflectometer can be used to find the complex reflection coefficient of an unknown device under test over a relatively broad frequency range based on the three measured power amplitudes of the three probes. The designed three-probe reflectometer is expected to provide results comparable to those provided by a commercial vector network analyser. Besides simple, the main advantage of this threeprobe reflectometer is that it only involves scalar amplitude measurements and no phase-shift measurements, whereby it has less electronic circuit component requirements and reduces the cost of the electronic components, as well as it is insensitive to the operating temperature. The main contribution of this work is that the operating bandwidth of the reflectometer has been improved by optimizing the distance or space position between the three probes along the transmission line. Besides that, a calibration process was designed to eliminate systematic errors of reflectometer. 2020 Thesis NonPeerReviewed application/pdf en http://eprints.utm.my/93004/1/ObaidallahIbrahimMSKE2020.pdf Mohamed Elshafiey, Obaidallah Ibrahim (2020) Compact multiport reflectometer for microwave material characterization. Masters thesis, Universiti Teknologi Malaysia, Faculty of Engineering - School of Electrical Engineering. http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:135865 |
| spellingShingle | TK Electrical engineering. Electronics Nuclear engineering Mohamed Elshafiey, Obaidallah Ibrahim Compact multiport reflectometer for microwave material characterization |
| title | Compact multiport reflectometer for microwave material characterization |
| title_full | Compact multiport reflectometer for microwave material characterization |
| title_fullStr | Compact multiport reflectometer for microwave material characterization |
| title_full_unstemmed | Compact multiport reflectometer for microwave material characterization |
| title_short | Compact multiport reflectometer for microwave material characterization |
| title_sort | compact multiport reflectometer for microwave material characterization |
| topic | TK Electrical engineering. Electronics Nuclear engineering |
| url | http://eprints.utm.my/93004/1/ObaidallahIbrahimMSKE2020.pdf |
| work_keys_str_mv | AT mohamedelshafieyobaidallahibrahim compactmultiportreflectometerformicrowavematerialcharacterization |