Compact multiport reflectometer for microwave material characterization
In this project, a simple, innovative, and compact three-probe reflectometer has been developed. The reflectometer can be used to find the complex reflection coefficient of an unknown device under test over a relatively broad frequency range based on the three measured power amplitudes of the three...
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| Format: | Thesis |
| Language: | English |
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2020
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| Online Access: | http://eprints.utm.my/93004/1/ObaidallahIbrahimMSKE2020.pdf |