Rasch measurement analysis for validation instrument to evaluate students technical readiness for embedded systems

Embedded systems have become a significant manufacturing sector and essential in our life due to their large applications. As a result, higher education institutions acknowledge the significance for offering embedded system design course to electrical, electronics, and computer engineering students....

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Main Authors: Ridwan, Intisar Ibrahim, Ali, Rosmah, Mohamed, Izzeldin Ibrahim, Adam, Mohamad Zulkefli, ElFadil, Nazar
Format: Conference or Workshop Item
Published: 2017
Subjects:
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author Ridwan, Intisar Ibrahim
Ali, Rosmah
Mohamed, Izzeldin Ibrahim
Adam, Mohamad Zulkefli
ElFadil, Nazar
author_facet Ridwan, Intisar Ibrahim
Ali, Rosmah
Mohamed, Izzeldin Ibrahim
Adam, Mohamad Zulkefli
ElFadil, Nazar
author_sort Ridwan, Intisar Ibrahim
collection ePrints
description Embedded systems have become a significant manufacturing sector and essential in our life due to their large applications. As a result, higher education institutions acknowledge the significance for offering embedded system design course to electrical, electronics, and computer engineering students. Unfortunately, embedded systems design course continues to be challenging and complex despite current attempts in introducing new embedded system teaching methods. This paper deals with this issue by developing and validating an instrument to measure students' readiness to learn embedded systems using Rasch model. An expert panel was used to verify the content validity and a pilot study (N = 40 respondents) was performed to measure the instrument reliability. A total of 365 respondents from different universities completed the 10-item scale and provided demographic data. The scale dimensionality was evaluated using WINSTEPS 3.92.1, with results showed that all the items fit the Rasch measurement model with acceptable fit index (0.6-1.4) and expressed revealed good consistency, with reliability alpha of 1.00 and 0.72 for items and persons respectively. The instrument was found to have appropriate psychometric properties, and the overall results are well aligned with theoretical expectations. This work has shown that the students were not technically ready for embedded system study.
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spelling utm.eprints-970142022-09-12T04:45:40Z http://eprints.utm.my/97014/ Rasch measurement analysis for validation instrument to evaluate students technical readiness for embedded systems Ridwan, Intisar Ibrahim Ali, Rosmah Mohamed, Izzeldin Ibrahim Adam, Mohamad Zulkefli ElFadil, Nazar T Technology (General) Embedded systems have become a significant manufacturing sector and essential in our life due to their large applications. As a result, higher education institutions acknowledge the significance for offering embedded system design course to electrical, electronics, and computer engineering students. Unfortunately, embedded systems design course continues to be challenging and complex despite current attempts in introducing new embedded system teaching methods. This paper deals with this issue by developing and validating an instrument to measure students' readiness to learn embedded systems using Rasch model. An expert panel was used to verify the content validity and a pilot study (N = 40 respondents) was performed to measure the instrument reliability. A total of 365 respondents from different universities completed the 10-item scale and provided demographic data. The scale dimensionality was evaluated using WINSTEPS 3.92.1, with results showed that all the items fit the Rasch measurement model with acceptable fit index (0.6-1.4) and expressed revealed good consistency, with reliability alpha of 1.00 and 0.72 for items and persons respectively. The instrument was found to have appropriate psychometric properties, and the overall results are well aligned with theoretical expectations. This work has shown that the students were not technically ready for embedded system study. 2017 Conference or Workshop Item PeerReviewed Ridwan, Intisar Ibrahim and Ali, Rosmah and Mohamed, Izzeldin Ibrahim and Adam, Mohamad Zulkefli and ElFadil, Nazar (2017) Rasch measurement analysis for validation instrument to evaluate students technical readiness for embedded systems. In: 2016 IEEE Region 10 Conference, TENCON 2016, 22 - 25 November 2016, Singapore. http://dx.doi.org/10.1109/TENCON.2016.7848399
spellingShingle T Technology (General)
Ridwan, Intisar Ibrahim
Ali, Rosmah
Mohamed, Izzeldin Ibrahim
Adam, Mohamad Zulkefli
ElFadil, Nazar
Rasch measurement analysis for validation instrument to evaluate students technical readiness for embedded systems
title Rasch measurement analysis for validation instrument to evaluate students technical readiness for embedded systems
title_full Rasch measurement analysis for validation instrument to evaluate students technical readiness for embedded systems
title_fullStr Rasch measurement analysis for validation instrument to evaluate students technical readiness for embedded systems
title_full_unstemmed Rasch measurement analysis for validation instrument to evaluate students technical readiness for embedded systems
title_short Rasch measurement analysis for validation instrument to evaluate students technical readiness for embedded systems
title_sort rasch measurement analysis for validation instrument to evaluate students technical readiness for embedded systems
topic T Technology (General)
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