Handling imbalance visualized pattern dataset for yield prediction

The prediction of the yield outcome in a non close loop manufacturing process can be achieved by visualizing the historical data pattern generated from the inspection machine, transform the data pattern and map it into machine learning algorithm for training, in order to automatically generate...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों: Megat Mohamed Noor, Megat Norulazmi, Jusoh, Shaidah
स्वरूप: Book Section
भाषा:English
प्रकाशित: IEEE Computer Society 2008
विषय:
ऑनलाइन पहुंच:https://repo.uum.edu.my/id/eprint/2858/1/04631657_Megat_Norulazmi_Megat_Mohamed_Noor.pdf

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