Showing
1 - 1
results of
1
for search '
"Anaheim, California"
'
Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文(繁體)
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Page will reload when a filter is removed.
Reset Filters
Applied Filters:
Author:
Remove Filter
Bosman, Michel
Page will reload when a filter is removed.
Reset Filters
Show filters (1)
Author:
Remove Filter
Bosman, Michel
Search Results - "Anaheim, California"
Showing
1 - 1
results of
1
for search '
"Anaheim, California"
'
, query time: 0.07s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
Call Number
Author
Title
1
Role of grain boundary percolative defects and localized trap generation on the reliability statistics of high-κ gate dielectric stacks
by
Raghavan, Nagarajan
,
Pey, Kin Leong
,
Shubhakar, K.
,
Wu, X.
,
Liu, W. H.
,
Bosman, Michel
Published 2013
Get full text
Get full text
Conference Paper
Search Tools:
RSS Feed
Email Search
Back
Refine Results
Page will reload when a filter is selected or excluded.
Institution
Nanyang Technological University
1 results
1
Format
Conference Paper
1 results
1
Author
Bosman, Michel
Liu, W. H.
1 results
1
Pey, Kin Leong
1 results
1
Raghavan, Nagarajan
1 results
1
School of Electrical and Electronic Engineering
1 results
1
Shubhakar, K.
1 results
1
Wu, X.
1 results
1
see all…
Language
English
1 results
1
Year of Publication
From:
To: