Sub-micron thin film intrinsic Josephson junctions by Warburton, P, Kuzhakhmetov, A, Bell, C, Burnell, G, Blamire, MG, Wu, H, Grovenor, C, Schneidewind, H

“…We have fabricated sub-micron intrinsic Josephson junctions in thin films of Tl-Ba-Ca-Cu-O using two differing techniques suited to different applications. …”

Critical-current suppression in sub-micron intrinsic Josephson junction arrays by Fenton, J, Korsah, M, Grovenor, C, Warburton, P

Josephson current suppression in three-dimensional focused-ion-beam fabricated sub-micron intrinsic junctions by Warburton, P, Fenton, J, Korsah, M, Grovenor, C

Switchable phase diffusion in intrinsic Josephson junction arrays by Fenton, J, Korsah, M, Grovenor, C, Warburton, P

“…We report current-voltage measurements on arrays of high-T-c intrinsic Josephson junctions showing a temperature dependence of the first critical current which is different from that of subsequent critical currents for an array with sub-micron dimensions. This can be explained by the change in the impedance seen by other array-junctions once one junction switches out of the supercurrent state, resulting in a switching-off of thermally activated phase-diffusion. …”

In-plane magnetic field dependence of intrinsic Josephson junctions in Tl-Ba-Ca-Cu-O thin films by Warburton, P, Chana, O, Kuzhakhmetov, A, Hyland, D, Dew-Hughes, D, Grovenor, C, Koval, Y, Muller, P

“…Our results suggest that the development of a sub-mm-wave oscillator using these bridges will require sub-micron patterning.…”

Analysis of FeySe1-xTex thin films grown by radio frequency sputtering by Speller, S, Aksoy, C, Saydam, M, Taylor, H, Burnell, G, Boothroyd, A, Grovenor, C

“…Large scale compositional variations are found to exist in some samples, and it is believed that sub-micron scale chemical inhomogeneities are present in all samples. …”

Microstructural analysis of phase separation in iron chalcogenide superconductors by Speller, S, Britton, T, Hughes, G, Krzton-Maziopa, A, Pomjakushina, E, Conder, K, Boothroyd, A, Grovenor, C

“…Here we have used a range of complementary scanning electron microscope based techniques, including high-resolution electron backscatter di raction mapping, to assess local variations in composition and lattice parameter with high precision and sub-micron spatial resolution. Phase separation is observed in the Csx Fe2-ySe2 crystals, with the minor phase distributed in a plate-like morphology throughout the crystal. …”

NanoSIMS analysis of arsenic and selenium in cereal grain. by Moore, K, Schröder, M, Lombi, E, Zhao, F, Zhao, F, McGrath, S, Hawkesford, M, Shewry, P, Grovenor, C

“…NanoSIMS indicated that the high intensity of As identified in the S-XRF image was localized in micron-sized hotspots near the ovular vascular trace and nucellar projection. …”

Quantitative EELS analysis of zirconium alloy metal/oxide interfaces. by Ni, N, Lozano-Perez, S, Sykes, J, Grovenor, C

“…This difference could arise from the different corrosion resistances of the alloys or, more likely, as a result of the transition in oxidation behaviour, which refers to a sharp increase in the oxidation rate when the oxide is a few microns thick.…”

Quantitative EELS analysis of zirconium alloy metal/oxide interfaces by Ni, N, Lozano-Perez, S, Sykes, J, Grovenor, C

“…This difference could arise from the different corrosion resistances of the alloys or, more likely, as a result of the transition in oxidation behaviour, which refers to a sharp increase in the oxidation rate when the oxide is a few microns thick. © 2010 Elsevier B.V.…”

Use of NanoSIMS in the search for early life on Earth: ambient inclusion trails in a c. 3400 Ma sandstone by Wacey, D, Kilburn, MR, McLoughlin, N, Parnell, J, Stoakes, C, Grovenor, C, Brasier, M

“…In doing so, we demonstrate the unique ability of the NanoSIMS to combine sub-micron scale imaging with in situ chemical and isotopic data, thereby enhancing our ability to evaluate the biogenicity criteria for Archaean microstructures. …”

Time-of-flight secondary ion mass spectrometry - fundamental issues for quantitative measurements and multivariate data analysis by Lee, J

“…These include: the lack of metrology and fundamental understanding for the use of novel cluster primary ion beams such as C60ⁿ⁺ and Ar₂₀₀₀⁺; the need for validated and robust measurement protocols for difficult samples, such as those with significant micron scale surface topography; the lack of guidance on novel data analysis methods including multivariate analysis which have the potential to simplify many time-consuming and intensive analyses in industry; and the need to establish best practice to improve the accuracy of measurements. …”