Residual stress evaluation and modelling at the micron scale by Salvati, E

Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale by Sebastiani, M, Eberl, C, Bemporad, E, Korsunsky, A, Nix, W, Carassiti, F

“…A novel method is presented for the assessment of the Poisson's ratio and residual stress on the micron scale, based on focused ion beam (FIB) two-step four-slot micro-milling and in-situ digital image correlation (DIC) analysis of the induced relaxation strains at the specimen's surface. …”

Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale by Sebastiani, M, Eberl, C, Bemporad, E, Korsunsky, A, Nix, W, Carassiti, F

“…A novel method is presented for the assessment of the Poisson's ratio and residual stress on the micron scale, based on focused ion beam (FIB) two-step four-slot micro-milling and in-situ digital image correlation (DIC) analysis of the induced relaxation strains at the specimen's surface.The methodology has been fully validated through modelling and experiments on three different materials, namely, physical vapour deposition (PVD) chromium nitride (CrN), and as-deposited and annealed Cu thin films. …”

Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging by Song, X, Yeap, K, Zhu, J, Belnoue, J, Sebastiani, M, Bemporad, E, Zeng, K, Korsunsky, A

“…Residual stress evaluation in thin films at the sub-micron scale was achieved in the present study using a semi-destructive trench-cutting (ring-core) method. …”

Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging by Song, X, Yeap, K, Zhu, J, Belnoue, J, Sebastiani, M, Bemporad, E, Zeng, K, Korsunsky, A

Synchrotron X-Ray Tomographic Investigation of Internal Structure of Individual Flax Fibres by Abbey, B, Eve, S, Thuault, A, Charlet, K, Korsunsky, A

“…High resolution synchrotron X-ray tomography (voxel size ~0.35 microns) on the TOMCAT station at the Swiss Light Source was used to create three-dimensional visualisation of the internal structure of individual flax fibres. …”

Synchrotron X-ray quantitative evaluation of transient deformation and damage phenomena in a single Nickel-rich cathode particle by Romano Brandt, L, Marie, J-J, Moxham, T, Forstermann, D, Salvati, E, Besnard, C, Papadaki, C, Wang, Z, Bruce, P, Korsunsky, A

“…Experimental characterisation of the transient mechanisms underlying crack and void formation requires the combination of very high resolution in space (sub-micron) and time (sub-second) domains without charge interruption. …”

Understanding nature's residual strain engineering at the human dentine-enamel junction interface by Sui, T, Lunt, A, Baimpas, N, Sandholzer, M, Li, T, Zeng, K, Landini, G, Korsunsky, A

“…In this study, we applied a recently developed flexible and versatile method for measuring the residual elastic strain at (sub)micron-scale utilising focused ion beam (FIB) milling with digital image correlation (DIC). …”

Focused ion beam ring drilling for residual stress evaluation by Korsunsky, A, Sebastiani, M, Bemporad, E

“…The technique proposed represents a substantial improvement over prior attempts, constituting an efficient semi-destructive method for accurate residual stress evaluation at the (sub)micron scale.…”

Focused ion beam ring drilling for residual stress evaluation by Korsunsky, A, Sebastiani, M, Bemporad, E

“…The technique proposed represents a substantial improvement over prior attempts, constituting an efficient semi-destructive method for accurate residual stress evaluation at the (sub)micron scale. © 2009 Elsevier B.V. All rights reserved.…”

On the cyclic deformation and residual stress in Ni-base single crystal superalloys by Ying, S, Sui, T, Lunt, A, Reed, R, Korsunsky, A

“…We also report the application of a recently developed flexible methodology for measuring (sub)micron scale residual stress utilizing Focused Ion Beam and Digital Image Correlation (FIB-DIC) techniques in the ring-core drilling geometry.…”

High energy transmission micro-beam Laue synchrotron X-ray diffraction by Hofmann, F, Song, X, Jun, T, Abbey, B, Peel, M, Daniels, J, Honkimäki, V, Korsunsky, A

“…Traditionally the technique operates in reflection geometry with a polychromatic X-ray beam focused to a sub-micron spot and with photon energy ranging from approximately 5 to 30 keV. …”

Uncertainty quantification of residual stress evaluation by the FIB–DIC ring-core method due to elastic anisotropy effects by Salvati, E, Sui, T, Korsunsky, A

“…We demonstrate an experimental application of this procedure to a real case of micron scale residual stress analysis in a nickel-base superalloy.…”

High energy transmission micro-beam Laue synchrotron X-ray diffraction by Hofmann, F, Song, X, Jun, T, Abbey, B, Peel, M, Daniels, J, Honkimaeki, V, Korsunsky, A

“…Traditionally the technique operates in reflection geometry with a polychromatic X-ray beam focused to a sub-micron spot and with photon energy ranging from approximately 5 to 30 keV. …”

Residual strain measurement by synchrotron diffraction by Withers, P, Preuss, M, Webster, P, Hughes, D, Korsunsky, A

“…Gauge dimensions as small as microns and sub-second measurement times give the technique unique characteristics, making 2 and 3 dimensional strain mapping economically feasible. …”

Residual strain measurement by synchrotron diffraction by Withers, P, Preuss, M, Webster, P, Hughes, D, Korsunsky, A

“…Gauge dimensions as small as microns and sub-second measurement times give the technique unique characteristics, making 2 and 3 dimensional strain mapping economically feasible. …”

The effect of surface damage and residual stresses on the fatigue life of nickel superalloys at high temperature by Fleury, R, Salvati, E, Nowell, D, Korsunsky, A, Silva, F, Tai, Y

“…The residual stress distribution underneath the dent root obtained numerically was compared with the measurements on experimentally simulated damaged specimens using ring-core milling at the micron scale through a combined Focused-Ion Beam and Digital Image Correlation technique (FIB-DIC). …”

Strengthening mechanisms in an Al-Fe-Cr-Ti nano-quasicrystalline alloy and composites by Pedrazzini, S, Galano, M, Audebert, F, Collins, D, Hofmann, F, Abbey, B, Korsunsky, A, Lieblich, M, Garcia Escorial, A, Smith, G

“…The processing condition employed in this study provided micron-sized grains with a strong [111] preferential orientation along the extrusion direction and a bimodal size distribution of the icosahedral nano-quasicrystalline precipitates. …”

Strengthening mechanisms in an Al-Fe-Cr-Ti nano-quasicrystalline alloy and composites by Pedrazzini, S, Galano, M, Audebert, F, Collins, D, Hofmann, F, Abbey, B, Korsunsky, A, Lieblich, M, Escorial, A, Smith, G

“…The processing condition employed in this study provided micron-sized grains with a strong [111] preferential orientation along the extrusion direction and a bimodal size distribution of the icosahedral nano-quasicrystalline precipitates. …”

Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for do evaluation by Baimpas, N, Le Bourhis, E, Eve, S, Thiaudière, D, Hardie, C, Korsunsky, A

“…Nanocrystalline metallic coatings of sub-micron thickness are widely used in modern microelectronic applications. …”