Towards on-chip spectroscopy based on a single microresonator by Zhang, Lin, Li, Guifang, Wang, Jing, Guo, Yuhao, Michel, Jurgen, Han, Zhaohong, Kimerling, Lionel C, Agarwal, Anuradha

“…Based on the analysis, we propose a novel architecture of on-chip spectroscopy systems in the mid-IR.…”
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Depth-resolved cathodoluminescence spectroscopy of silicon supersaturated with sulfur by Fabbri, Filippo, Smith, Matthew J., Recht, Daniel, Aziz, Michael J., Salviati, Giancarlo, Gradecak, Silvija

“…We investigate the luminescence of Si supersaturated with S (Si:S) using depth-resolved cathodoluminescence spectroscopy and secondary ion mass spectroscopy as the S concentration is varied over 2 orders of magnitude (10[superscript 18]–10[superscript 20] cm[superscript −3]). …”
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Insights into Electrochemical Reactions from Ambient Pressure Photoelectron Spectroscopy by Crumlin, Ethan J., Bluhm, Hendrik, Stoerzinger, Kelsey Ann, Hong, Wesley Terrence, Shao-Horn, Yang

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High-performance and scalable on-chip digital Fourier transform spectroscopy by Kita, Derek M, Miranda, Brando, Favela, David, Bono, David, Michon, Jérôme, Lin, Hongtao, Gu, Tian, Hu, Juejun

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Time-resolved, dual heterodyne phase collection transient grating spectroscopy by Dennett, Cody Andrew, Short, Michael P

“…The application of optical heterodyne detection for transient grating spectroscopy (TGS) using a fixed, binary phase mask often relies on taking the difference between signals captured at multiple heterodyne phases. …”
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Genome-inspired molecular identification in organic matter via Raman spectroscopy by Liu, Yun, Ferralis, Nicola, Bryndzia, L. Taras, Grossman, Jeffrey C.

“…Rapid, non-destructive characterization of molecular level chemistry for organic matter (OM) is experimentally challenging. Raman spectroscopy is one of the most widely used techniques for non-destructive chemical characterization, although it currently does not provide detailed identification of molecular components in OM, due to the combination of diffraction-limited spatial resolution and poor applicability of peak-fitting algorithms. …”
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Reversibility of Ferri-/Ferrocyanide Redox during Operando Soft X-ray Spectroscopy by Regier, Tom Z., Peak, Derek, Sayed, Sayed Youssef, Risch, Marcel, Stoerzinger, Kelsey Ann, Shao-Horn, Yang

“…We studied its photochemical response to intense synchrotron radiation by in situ X-ray absorption spectroscopy (XAS). For photon flux densities equal to and above 2 × 1011 s–1 mm–2, precipitation of ferric (hydr)oxide from both ferricyanide and ferrocyanide solutions was clearly detectable, despite flowing fast enough to replace the solution in the flow cell every 0.4 s (flow rate 1.5 mL/min). …”
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Thermal diffusivity determination using heterodyne phase insensitive transient grating spectroscopy by Dennett, Cody Andrew, Short, Michael P

“…The elastic and thermal transport properties of opaque materials may be measured using transient grating spectroscopy (TGS) by inducing and monitoring periodic excitations in both reflectivity and surface displacement. …”
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Quantifying thermal transport in amorphous silicon using mean free path spectroscopy by Pan, Ying, Zhou, Jiawei, Chen, Gang

“…Our results suggest mean free path spectroscopy is a versatile tool for understanding thermal transport in disordered systems.…”
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Exciton-phonon coupling in individual GaAs nanowires studied using resonant Raman spectroscopy by Schimek, Oliver, Reich, Stephanie, Brewster, Megan Marie, Gradecak, Silvija

“…The Fröhlich coupling strength of individual GaAs nanowires is investigated by resonant micro-Raman spectroscopy measurements near the direct bandgap E[subscript g]2. …”
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Resonance Raman spectroscopy in Si and C ion-implanted double-wall carbon nanotubes by Dresselhaus, Mildred, Saraiva, G. D., Souza Filho, Antonio, Braunstein, G., Barros, Eduardo B., Filho, J. Mendes, Moreira, E. C., Fagan, S. B., Baptista, D. L., Kim, Y. A., Muramatsu, Hiroyuki, Endo, M.

“…The effect of 170 keV Si and 100 keV C ion bombardment on the structure and properties of highly pure, double-wall carbon nanotubes has been investigated using resonance Raman spectroscopy. The implantations were performed at room temperature with ion doses ranging between 1×1013  ions/cm2 and 1×1015 ions/cm2. …”
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Determination of bandgap states in p-type In[subscript 0.49]Ga[subscript 0.51]P grown on SiGe/Si and GaAs by deep level optical spectroscopy and deep level transient spectroscopy by Gonzalez, Maria, Carlin, A. M., Dohrman, C. L., Ringel, S. A., Fitzgerald, Eugene A.

“…The presence and properties of traps in p-type In[subscript 0.49]Ga[subscript 0.51]P grown on low dislocation density, metamorphic Ge/SiGe/Si substrates and GaAs substrates were determined using deep level transient spectroscopy (DLTS) and deep level optical spectroscopy (DLOS) leading to the quantification of trap behavior throughout the entire 1.9 eV bandgap of the In[subscript 0.49]Ga[subscript 0.51]P material as a function of substrate. …”
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Uniaxial strain in graphene by Raman spectroscopy: G peak splitting, Grüneisen parameters, and sample orientation by Mohiuddin, T. M. G., Lombardo, A., Nair, R. R., Bonetti, A., Savini, G., Jalil, R., Bonini, Nicola, Basko, D. M., Galiotis, C., Marzari, Nicola, Novoselov, Kostya S., Geim, A. K., Ferrari, A. C.

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In Situ Ambient Pressure X-ray Photoelectron Spectroscopy Studies of Lithium-Oxygen Redox Reactions by Lu, Yi-chun, Crumlin, Ethan J., Veith, Gabriel M., Harding, Jonathon R., Mutoro, Eva, Baggetto, Loic, Dudney, Nancy J., Liu, Zhi, Shao-Horn, Yang

“…Here we employ a solid-state Li4+xTi5O12/LiPON/LixV2O5 cell and examine in situ the chemistry of Li-O2 reaction products on LixV2O5 as a function of applied voltage under ultra high vacuum (UHV) and at 500 mtorr of oxygen pressure using ambient pressure X-ray photoelectron spectroscopy (APXPS). Under UHV, lithium intercalated into LixV2O5 while molecular oxygen was reduced to form lithium peroxide on LixV2O5 in the presence of oxygen upon discharge. …”
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Simultaneous electrical impedance and optical absorption spectroscopy for rapid characterization of oxygen vacancies and small polarons in doped ceria by Kalaev, D., Tuller, H. L.

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Photoemission Spectroscopy of Magnetic and Nonmagnetic Impurities on the Surface of the Bi[subscript 2]Se[subscript 3] Topological Insulator by Valla, T., Pan, Z. -H., Gardner, Dillon Richard, Lee, Young S., Chu, Shaoyan

“…We present angle-resolved photoemission spectroscopy studies of the electronic structure and the scattering rates upon the adsorption of various magnetic and nonmagnetic impurities on the surface of Bi[subscript 2]Se[subscript 3], a model topological insulator. …”
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Probing LaMO₃ Metal and Oxygen Partial Density of States Using X‑ray Emission, Absorption, and Photoelectron Spectroscopy by Moritz, Brian, Devereaux, Thomas P., Yang, Wanli, Hong, Wesley Terrence, Stoerzinger, Kelsey Ann, Shao-Horn, Yang

“…We then developed a method for the self-consistent alignment of the emission data onto a common energy scale using these features, providing a valuable supplementary technique to photoelectron spectroscopy for studying the partial density of states in perovskites. …”
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Measurement of an Exceptionally Weak Electron-Phonon Coupling on the Surface of the Topological Insulator Bi[subscript 2]Se[subscript 3] Using Angle-Resolved Photoemission Spectroscopy by Pan, Z. -H., Fedorov, A. V., Gardner, Dillon Richard, Lee, Young S., Chu, S., Valla, T.

“…Here, we studied temperature dependence of the electronic structure and the scattering rates on the surface of a model topological insulator, Bi[subscript 2]Se[aubscript 3], by high-resolution angle-resolved photoemission spectroscopy. We found an extremely weak broadening of the topological surface state with temperature and no anomalies in the state’s dispersion, indicating exceptionally weak electron-phonon coupling. …”
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Oxygen Surface Exchange Kinetics Measurement by Simultaneous Optical Transmission Relaxation and Impedance Spectroscopy: Sr(Ti,Fe)O[subscript 3-x] Thin Film Case Study by Perry, Nicola, Kim, Jae Jin, Tuller, Harry L

“…We compare approaches to measure oxygen surface exchange kinetics, by simultaneous optical transmission relaxation (OTR) and AC-impedance spectroscopy (AC-IS), on the same mixed conducting SrTi[subscript 0.65]Fe[subscript 0.35]O[subscript 3-x] film. …”
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Electronic Structure of the Topological Insulator Bi[subscript 2]Se[subscript 3] Using Angle-Resolved Photoemission Spectroscopy: Evidence for a Nearly Full Surface Spin Polarization by Pan, Z.-H., Vescovo, E., Fedorov, A. V., Gardner, Dillon Richard, Lee, Young S., Chu, Shaoyan, Gu, G. D., Valla, T.

“…We performed high-resolution spin- and angle-resolved photoemission spectroscopy studies of the electronic structure and the spin texture on the surface of Bi[subscript 2]Se[subscript 3], a model TI. …”
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