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Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope.
Published 2009Journal article -
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Optimal tilt magnitude determination for aberration-corrected super resolution exit wave function reconstruction.
Published 2009Journal article -
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Accurate evaluation of aberration for probe-forming system and influence of aberration on high-resolution STEM image
Published 2017Conference item -
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Characterization of thin film displacements in the electron microscope
Published 2017Journal article -
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Direct Measurement of the Crystallographically Sensitive Atomic Termination of Nanophase Cerium Dioxide
Published 2012Journal article -
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9
Orientation dependent interlayer stacking structure in bilayer MoS2 domains
Published 2017Journal article -
10
Aberration measurement of the probe-forming system of an electron microscope using two-dimensional materials
Published 2017Journal article -
11
Atomically sharp interlayer stacking shifts at anti-phase grain boundaries in overlapping MoS2 secondary layers
Published 2018Journal article -
12
Preferential Pt nanocluster seeding at grain boundary dislocations in polycrystalline monolayer MoS2
Published 2018Journal article -
13
Atomic structure and formation mechanism of sub-nanometer pores in 2D monolayer MoS2.
Published 2017Journal article -
14
In situ atomic-scale studies of the formation of epitaxial Pt nanocrystals on monolayer molybdenum disulfide
Published 2017Journal article -
15
Fast deterministic single-exposure coherent diffractive imaging at sub-Angstrom resolution
Published 2013Journal article -
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A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
Published 2005Journal article -
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Atomic structure and dynamics of single platinum atom interactions with monolayer MoS2
Published 2017Journal article -
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Atomic resolution defocused electron ptychography at low dose with a fast, direct electron detector
Published 2019Journal article