Direct Detectors for Electron Microscopy by Clough, R, Moldovan, G, Kirkland, A

“…There is interest in improving the detectors used to capture images in transmission electron microscopy. Detectors with an improved modulation transfer function at high spatial frequencies allow for higher resolution in images at lower magnification, which leads to an increased effective field of view. …”

ELECTRON-MICROSCOPY OF EPITAXIAL STRUCTURES by Kiselev, N, Vasiliev, A, Lebedev, O, Givargizov, E, Stepanova, A, Kiselev, A, Hutchison, J

Transmission electron microscopy: Overview and challenges by Pennycook, S, Lupini, A, Borisevich, A, Varela, M, Peng, Y, Nellist, P, Duscher, G, Buczko, R, Pantelides, S

“…We review recent advances in aberration-corrected scanning transmission electron microscopy that allow sub-Angstrom beams to be used for imaging and spectroscopy, with enormous improvement in sensitivity for single atom detection and the investigation of interfacial electronic structure. …”

Electron microscopy of wet cells and tissues by Gileadi, O, Behar, V, Ezer, S, Horowitz, M, Nechushtan, A, Sabban, A, Sprinzak, D, Vainshtein, A, Zik, O

Z-contrast scanning transmission electron microscopy by Pennycook, S, Nellist, P

DETECTION OF VIRUSES IN RECOMBINANT CELLS BY ELECTRON-MICROSCOPY by Liptrot, C, Gull, K

ELECTRON-MICROSCOPY OF PROCESS-INDUCED CRYSTAL DEFECTS by Heydenreich, J

Measuring isoplanaticity in high-resolution electron microscopy by Meyer, R, Kirkland, A

Applications of the weak beam technique of electron microscopy by Cockayne, D

Electron microscopy in materials science a historical perspective by Hirsch, P

“…While initially the main applications of electron microscopy were thought to be in biology, in the event the applications in materials science were found to be equally important. …”

Calculations of limited coherence for high resolution electron microscopy by Chang, L, Meyer, R, Kirkland, A

Transmission electron microscopy investigation of semiconductor quantum dots by Liao, X, Zou, J, Cockayne, D

“…Transmission electron microscopy was used to study InGaAs/GaAs and Ge(Si)/Si quantum dots. …”

Transmission electron microscopy without aberrations: Applications to materials science by Kirkland, A, Chang, L, Haigh, S, Hetherington, C

Determination of void arrangements in inverse opals by transmission electron microscopy by Blanford, C, Carter, C, Stein, A

“…We have developed a method that uses transmission electron microscopy (TEM) to probe the interior of individual sections of 3DOM photonic crystals by bright-field imaging followed by two-dimensional Fourier image analysis. …”

Transmission electron microscopy investigation of Bi-based HTS tapes. by Eastell, C, Henry, B, Morgan, C, Grovenor, C, Goringe, M, Burgoyne, J, DewHughes, D

Electron microscopy of multi-layered polymer-nanocomposite based dielectrics by Mahadevegowda, A, Young, N, Grant, P

“…Vacuum deposited polymer-nanocomposites (PNCs) comprising alternate layers of metal (Al/Ag) (filler) and polymer (nylon-6) (matrix) have been investigated using chemical, impedance spectroscopy and microstructural characterisation techniques. Electron microscopy investigations revealed the morphology, nanostructure and phases of nano-scale core (metal)-shell (oxide) particles and metallic nano-islands in Al and Ag based PNCs respectively. …”

Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes by Langford, R, Ozkaya, D, Huey, B, Petford-Long, A

“…Energy filtered transmission electron microscopy has been used to measure the thickness and the amount of preferential milling of the different layers of Spin-Tunnel Junction cross-sections, which consist of metal-insulator-metal layers prepared using this technique.…”

Aberration-corrected electron microscopy processing and imaging of novel organic and inorganic nanostructures by Nicolosi, V, Cosgriff, E, Coleman, J, Nellist, P

Thin silicon strip devices for direct electron detection in transmission electron microscopy by Moldovan, G, Li, X, Wilshaw, P, Kirkland, A

“…Indirect imaging detection systems used in transmission electron microscopy (TEM) impose a range of restrictions limiting performance that can be easily surpassed with direct sensing devices. …”

The open state of KirBac3.1 observed by cryo-electron microscopy by Zadek, B, Davies, K, Ashcroft, F, Johnson, L, Venien-Bryan, C