A biochemical and structural study of innate immune receptors by Huangfu, Zhiru

“…EMSA showed the binding affinity of proteins to NCP, but processing of Cryo-electron microscopy dataset showed no extra density besides NCP. …”
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Electron backscatter diffraction study for advanced semiconductor interconnect materials analysis by Lee, Aaron Wai Ken

“…As conventional sample preparation methods for electron microscopy inspection may not be sufficient for the stringent conditions that EBSD samples require, a modified sample preparation workflow is explored and validated as well. …”
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Investigation on the security of stored data in emerging non-volatile memory devices using AFM- based techniques by Tay, Jing Yun

“…In this study, RRAM and MRAM devices that are available in the market will first be analyzed through the use of failure analysis techniques such as chemical deprocessing, X-ray imaging and scanning electron microscopy (SEM) with focused ion beam (FIB) to understand its device architecture. …”
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The role of filler-epoxy interface and traps in the dielectric breakdown performance in epoxy moulding compounds (EMC) by Chua, Lin Xiao

“…The changes in the interfacial properties due to the type and amount of coupling agents were characterised using Fourier-Transform Infrared (FTIR) Spectroscopy, Dielectric Spectroscopy and Scanning Electron Microscopy (SEM). These characterisations were used to explore any correlations between the EMCs structural properties and deep trap properties, which was measured using Thermally Stimulated Depolarisation Current (TSDC) test system, and AC dielectric breakdown strength, which was measured using High Voltage (HV) AC tester. …”
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