Simulation of 0.18 micron MOSFET and its characterization by Ahmad Radzi, Syafeeza

“…The most common effect that generally occurs in the short channel MOSFETs are channel modulation, drain induced barrier lowering (DIBL), punch-through and hot electron effect. Several advanced method such as lightly-doped drain (LDD), halo implant and retrograde well is applied to reduce the short channel effects. …”
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Broadband plasmon photocurrent generation from Au nanoparticles/mesoporous TiO2 nanotube electrodes by Wu, Xu, Centeno, Anthony, Zhang, Xuemei, Darvill, Daniel, Ryan, Mary P., Riley, D. Jason, Alford, Neil M., Xie, Fang

“…Plasmonic induced photocurrent due to hot electrons is observed over a broad wavelength range (~500 to 1000 nm). …”