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Aberration Correction and Exit Wave Reconstruction Using Tilt Azimuth Data
Published 2009Journal article -
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"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.
Published 2004Journal article -
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"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
Published 2004Journal article -
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In‐Situ annealing of the (110) and (001) surfaces of SrTiO3 nanocuboids by high‐resolution transmission electron microscopy
Published 2018Journal article -
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Applications of the Oxford-JEOL aberration-corrected electron microscope
Published 2010Journal article -
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Combining theory and experiment in determining the surface chemistry of nanocrystals
Published 2008Journal article -
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Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction
Published 2004Conference item -
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High resolution electron exit wave reconstruction from a diffraction pattern using Gaussian basis decomposition
Published 2014Conference item -
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