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Laterally non-uniform doping profiles on MOSFETs : modeling and analysis
Published 2008Get full text
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243
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244
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247
Measurement and modeling of transient effects in partially-depleted SOI MOSFETs
Published 2005Get full text
Thesis -
248
Modeling of electron transport in sub-100 nm channel length silicon MOSFETs
Published 2005Get full text
Thesis -
249
Effect of point defect generation on transient enhanced diffusion
Published 2005Get full text
Thesis -
250
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251
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252
Semiconductor process design : representations, tools, and methodologies
Published 2006Get full text
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253
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254
CMOS inverse doping profile extraction and substrate current modeling
Published 2013Get full text
Thesis -
255
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Non-stationary transport effects in deep sub-micron channel Si mosfets
Published 2005Get full text
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260