Mueller Matrix Ellipsometric Approach on the Imaging of Sub-Wavelength Nanostructures by Tim Käseberg, Jana Grundmann, Thomas Siefke, Petr Klapetek, Petr Klapetek, Miroslav Valtr, Miroslav Valtr, Stefanie Kroker, Stefanie Kroker, Stefanie Kroker, Bernd Bodermann

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Ellipsometry/ by International Conference on Ellipsometry (3rd : 1975 : University of Nebraska, Lincoln), Bashara, N. M., Azzam, R. M. A.

Subjects: “…Ellipsometry…”

Ellipsometry and polarized light/ by 288262 Azzam, R. M. A., Bashara, N. M.

Subjects: “…Ellipsometry…”

In Situ Monitoring of Aptamer–Protein Binding on a ZnO Surface Using Spectroscopic Ellipsometry by Adeem Alshammari, Harm van Zalinge, Ian Sandall

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Fundamentals and applications of spectroscopic ellipsometry by Débora Gonçalves, Eugene A. Irene

Subjects: “…ellipsometry…”
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Ellipsometry of Functional Organic Surfaces and Films / by Hinrichs, Karsten, Eichhorn, Klaus-Jochen

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COMBINATION OF THE SPIM, SPECTROSCOPIC ELLIPSOMETRY AND SURFACE PLASMON RESONANCE SPECTROSCOPY AS A NOVEL WAY FOR ANALYSIS OF MODEL MEMBRANES WITH INTERCALATED CLUSTERS, SELF-ORGAN... by Gradov O.V., Skrynnik A.A.

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Ellipsometry for industrial applications/ by 371299 Riedling, Karl

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Formação de multicamadas de polissacarídeos e proteína by Fujimoto Juliana, Reis Eduardo Alexandre de Oliveira, Petri Denise F. S., Campana Filho Sérgio P.

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Optical Investigation of ZnS/GaAs and CuGaS2/GaP Systems by Kh.N. Ahmadova, M.A. Musayev, N.N. Hashimova

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Interactions between Cetyltrimethylammonium Bromide Modified Cellulose Nanocrystals and Surfaces: An Ellipsometric Study by Xiaoyu Gong, Md Farhad Ismail, Yaman Boluk

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Extreme Ultraviolet Stokesmeter for Pulsed Magneto-Optics by Mabel Ruiz-Lopez, Francesco Barbato, Yasin Ekinci, Davide Bleiner

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In Situ Infrared and UV–Vis Ellipsometries to Probe The Varnish Ageing and Swelling of G. Bellini “Transfiguration” by Hélène Pasco, Arnaud Lesaine, Angela Cerasuolo, Cédric Boissière, Philippe Walter, Clément Sanchez, Laurence deViguerie, Marco Faustini

Subjects: “…environmental ellipsometry…”
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Dielectric function decomposition by dipole interaction distribution: application to triclinic K2Cr2O7 by C Sturm, S Höfer, K Hingerl, T G Mayerhöfer, M Grundmann

Subjects: “…ellipsometry…”
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Data Acquisition of TiO2 for Optical Material by using Spectroscopic Ellipsometry Technique by Asad Sabih Mohammad Raouf

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Characterisation of nanodimensional structures using spectroscopic ellipsometry by Mirić Milka M., Radović Marko B., Gajić Radoš B., Dohčević-Mitrović Zorana D., Popović Zoran V.

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APPLICATION OF THE EFFECTIVE IMPEDANCE METHOD FOR IN SITU ELLIPSOMETRIC ANALYSIS OF MAGNETIC FILMS by L.V. Panina, A.T. Morchenko, V.G. Kostishyn, D.N. Chitanov, R.D. Piliposyan

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Ultra-bright emission from Sr doped TiO2 nanoparticles through r-GO conjugation by Sanhita Mandal, Neha Jain, Mukesh Kumar Pandey, S. S. Sreejakumari, Prashant Shukla, Anupama Chanda, Sudipta Som, Subrata Das, Jai Singh

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THE INVESTIGATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED ETHANOL FILM BY ELLIPSOMETRIC METHOD by D.A. Kim, N.Yu. Sdobnyakov, N.V. Novozhilov, A.S. Antonov, D.N. Sokolov, E.A. Voronova, O.V. Mikhailova

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Combination of Multiple Operando and In-Situ Characterization Techniques in a Single Cluster System for Atomic Layer Deposition: Unraveling the Early Stages of Growth of Ultrathin... by Carlos Morales, Ali Mahmoodinezhad, Rudi Tschammer, Julia Kosto, Carlos Alvarado Chavarin, Markus Andreas Schubert, Christian Wenger, Karsten Henkel, Jan Ingo Flege

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