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    Efficient utilization of photoelectron-hole at semiconductor-microbe interface for pyridine degradation with assistance of external electric field

    Efficient utilization of photoelectron-hole at semiconductor-microbe interface for pyridine degradation with assistance of external electric field by Hefei Shi, Wenbo Fan, Xinbai Jiang, Dan Chen, Cheng Hou, Yixuan Wang, Yang Mu, Jinyou Shen

    Published 2024-01-01
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