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Search Results - "High-Resolution Scanning Capacitance Spectroscopy of Semiconductor Structures"
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"High-Resolution Scanning Capacitance Spectroscopy of Semiconductor Structures"
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Single-Electron Spectroscopy
by
Ashoori, Raymond C.
,
Tessmer, Stuart
,
Cohen, Aaron S.
,
Silevitch, Daniel M.
,
LeBlanc, William M.
,
Berman, David B.
,
Smith, Henry I.
,
Chan, Ho-Bun
,
Zhitenev, Nikolai
,
Brodsky, Mikhail G.
Published 2010
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High-Resolution Scanning Capacitance Spectroscopy of Semiconductor Structures
…”
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Technical Report
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Institution
Massachusetts Institute of Technology
1 results
1
Format
Technical Report
1 results
1
Author
Ashoori, Raymond C.
1 results
1
Berman, David B.
1 results
1
Brodsky, Mikhail G.
1 results
1
Chan, Ho-Bun
1 results
1
Cohen, Aaron S.
1 results
1
LeBlanc, William M.
1 results
1
Silevitch, Daniel M.
1 results
1
Smith, Henry I.
1 results
1
Tessmer, Stuart
1 results
1
Zhitenev, Nikolai
1 results
1
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Language
English
1 results
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