Showing 761 - 780 results of 1,895 for search '"MOSFET"', query time: 0.09s Refine Results
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    Comparación de las técnicas de extracción del voltaje de umbral basadas en la característica gm/ID del MOSFETs. by Arturo Fajardo Jaimes

    Published 2017-04-01
    Subjects: “…Threshold voltage extraction, MOSFET modeling, Gm/ID transconductance efficiency…”
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    Article
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    Compensation of Hot Carrier Degradation Enabled by Forward Back Bias in π-GAA-π MOSFET by Yijun Qian, Qiang Liu, Jialun Yao, Xiaowei Wang, Amit Kumar Shukla, Fengyu Liu, Tao Wu, Kai Lu, Yemin Dong, Xing Wei, Wenjie Yu, Zhiqiang Mu, Yumeng Yang

    Published 2023-01-01
    “…Forward back biasing (FBB) technique is considered as a potential solution for aging compensation in silicon on insulator (SOI) MOSFET. However, traditional SOI devices under FBB would suffer from extra off-state leakage current <inline-formula> <tex-math notation="LaTeX">$(I_{\mathrm{ off}})$ </tex-math></inline-formula> and undesirable static power consumption. …”
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    Article
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    A PCB-Incorporated Inductor Based Filter Design Solution for Differential Mode Noise of 3-Phase SiC-MOSFET Based VSI by Vibhav Pandey, Sougata Nayak, Kamalesh Hatua, Subhashish Bhattacharya

    Published 2024-01-01
    “…This paper proposes a PCB-incorporated inductor based segmented LCLC filter with high SRF value for high-frequency DM noise of SiC-MOSFET based VSI. The filter design is based on mathematical modeling of the DM noise of SiC-MOSFET based VSI. …”
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    Article
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    Effective channel length and external series resistance models of scaled LDD pMOSFETs operating in a Bi-MOS hybrid-mode environment by Seah, Lionel Siau Hing, Yeo, Kiat Seng, Ma, Jianguo, Do, Manh Anh

    Published 2009
    “…The effective channel length L-eff and total external series resistance R-TOTEXT of deep submicron lightly doped drain (LDD) pMOSFETs, operating in a Bi-MOS hybrid-mode environment, have been modeled as functions of bias and temperature. …”
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    Journal Article
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    Two dimensional analytical threshold voltage model of nanoscale strained Si/Si1-xGex MOSFETs including quantum mechanical effects by Siew, Kang Eng, Heong, Yau Wei, Anwar, Sohail, Razali, Ismail

    Published 2012
    “…A new analytical model derived from the Poisson equation for surface potential and threshold voltage (V th), including the Quantum Mechanical Effects (QMEs) is presented for nanoscale strained Si1–x Ge x MOSFETs. Boundary condition approaches are applied in the model. …”
    Article
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    Explicit continuous charge-based compact model for long channel heavily doped surrounding-gate MOSFETs incorporating interface traps and quantum effects by Hamzah, A., Hamid, F. A., Ismail, R.

    Published 2016
    “…An explicit solution for long-channel surrounding-gate (SRG) MOSFETs is presented from intrinsic to heavily doped body including the effects of interface traps and fixed oxide charges. …”
    Article
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    Explicit continuous charge-based compact model of surrounding gate MOSFET (SRGMOSFET) with smooth transition between partially-depleted to fully-depleted operation by Hamzah, Afiq, Alias, N. Ezaila, Tan, Michael Loong Peng, Ali Hosseingholipourasl, Ali Hosseingholipourasl, Ismail, Razali

    Published 2020
    “…A charge-based compact model that includes the dynamic depletion behavior for arbitrary doped surrounding gate MOSFET (SRGMOSFET) is presented in this paper. The one-dimensional Poisson's equation is first solved to obtain the continuous explicit solution of the mobile charge density and drain current expression. …”
    Article