Showing 781 - 800 results of 1,895 for search '"MOSFET"', query time: 0.09s Refine Results
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    Analytical models of threshold voltage and drain induced barrier lowering in junctionless cylindrical surrounding gate (JLCSG) MOSFET using stacked high-k oxide by Hakkee Jung

    Published 2022-03-01
    “…We proposed the analytical models to analyze shifts in threshold voltage and drain induced barrier lowering (DIBL) when the stacked SiO2/high-k dielectric was used as the oxide film of Junctionless Cylindrical Surrounding Gate (JLCSG) MOSFET. As a result of comparing the results of the presented model with those of TCAD, it was a good fit, thus proving the validity of the presented model. …”
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    Combined Influence of Gate Oxide and Back Oxide Materials on Self-Heating and DIBL Effect in 2D MOS<sub>2</sub>-Based MOSFETs by Atabek E. Atamuratov, Khushnudbek Sh. Saparov, Ahmed Yusupov, Jean Chamberlain Chedjou

    Published 2023-05-01
    “…In this paper, degradation effects, such as self-heating effect (SHE) and drain-induced barrier lowering (DIBL) effect in 2D MoS<sub>2</sub>-based MOSFETs are investigated through simulations. The SHE is simulated based on the thermodynamic transport model. …”
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  15. 795

    A Si IGBT/SiC MOSFET Hybrid Isolated Bidirectional DC–DC Converter for Reducing Losses and Costs of DC Solid State Transformer by Jun Huang, Yu Wang, Zhenfeng Li, Hongbo Zhu, Kai Li

    Published 2024-02-01
    “…This paper proposes a Si IGBT/SiC MOSFET hybrid isolated bidirectional DC–DC converter and an optimized modulation strategy (OMS) to reduce the losses and costs of DCSST. …”
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  16. 796

    Elicitation of Scattering Parameters of Dual-halo Dual-dielectric Triple-material Surrounding Gate (DH-DD-TM-SG) MOSFET for Microwave Frequency Applications by Neeraj Gupta, Prashant Kumar

    Published 2021-01-01
    “…The analytical result of DH-DD-TM-SG MOSFET is in accordance with the simulated results.…”
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    Improvement of channel-carrier mobility in 4H-SiC MOSFETs correlated with passivation of very fast interface traps using sodium enhanced oxidation by Arnar M. Vidarsson, Daniel Haasmann, Sima Dimitrijev, Einar Ö. Sveinbjörnsson

    Published 2023-05-01
    “…Very fast interface traps have recently been suggested to be the main cause behind the rather poor inversion channel mobility in nitrided SiC metal-oxide-semiconductor-field-effect-transistors (MOSFETs). Using capacitance voltage analysis and conductance spectroscopy on metal oxide semiconductor capacitors, at cryogenic temperatures, we find that these fast traps are absent in oxides made by sodium enhanced oxidation, and high inversion channel-carrier mobility in MOSFETs made by sodium enhanced oxidation is observed.…”
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