Picosecond metrology of laser-driven proton bursts by B. Dromey, M. Coughlan, L. Senje, M. Taylor, S. Kuschel, B. Villagomez-Bernabe, R. Stefanuik, G. Nersisyan, L. Stella, J. Kohanoff, M. Borghesi, F. Currell, D. Riley, D. Jung, C.-G. Wahlström, C.L.S. Lewis, M. Zepf

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Nonclassical correlations for quantum metrology in thermal equilibrium by Sone, Akira, Zhuang, Quntao, Liu, Yixiang, Cappellaro, Paola

“…Nonclassical correlations beyond entanglement might provide a resource in quantum information tasks, such as quantum computation or quantum metrology. Quantum discord is a measure of nonclassical correlations to which entanglement belongs as a subset. …”
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Statistical metrology and process control of quantum devices by Walsh, Michael P.,Ph. D.Massachusetts Institute of Technology.

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Metrology of very thin silicon epitaxial films by Chen, Weize, 1966-

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Accurate capacitive metrology for atomic force microscopy by Mazzeo, Aaron D. (Aaron David), 1979-

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Octave-spanning lasers for optical metrology applications by Matos, Lia Machado de

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New millennium interferometer laser metrology testbed by Ortiz, Julio Enrique

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Metrology of very thin silicon epitaxial films by Cherkassky, Alexander (Alexander Peter), 1963-

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Electrically addressable vesicles: Tools for dielectrophoresis metrology by Desai, Salil P., Vahey, Michael D., Voldman, Joel

“…This combined with the ability to encode information about the properties of the vesicle in its fluorescence signature forms the first steps toward the development of EAV populations as metrology tools for any DEP-based microsystem.…”
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Metrology techniques for compound rotary-linear motion by Vona, Marsette Arthur, 1977-

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RGB speckle pattern interferometry for surface metrology by Upputuri, Paul Kumar, Rajendran, Praveenbalaji, Pramanik, Manojit

“…Digital speckle pattern interferometry (DSPI) has been widely used for surface metrology of optically rough surfaces. Single visible wavelength can provide high measurement accuracy, but it limits the deformation measurement range of the interferometer. …”
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Deep learning in optical metrology: a review by Zuo, Chao, Qian, Jiaming, Feng, Shijie, Yin, Wei, Li, Yixuan, Fan, Pengfei, Han, Jing, Qian, Kemao, Chen, Qian

“…In this review, we present an overview of the current status and the latest progress of deep-learning technologies in the field of optical metrology. We first briefly introduce both traditional image-processing algorithms in optical metrology and the basic concepts of deep learning, followed by a comprehensive review of its applications in various optical metrology tasks, such as fringe denoising, phase retrieval, phase unwrapping, subset correlation, and error compensation. …”
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Digital in-line holography for dynamic micro-metrology by Hegde, Gopalkrishna M., Singh, Vijay Raj, Asundi, Anand Krishna

“…In this paper in-line digital holography has been explored for dynamic micro metrological applications. In in-line digital holography, full CCD sensor area is utilized for real image reconstruction of the objects with less speckle noise. …”
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Precision frequency metrology with optical lattice clocks by Bowden, W

IQK 212/3 - METROLOGI SEPT 01. by PPTI, Pusat Pengajian Teknologi Industri

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IQK 202/3 - METROLOGI JUN 1993. by PPTI, Pusat Pengajian Teknologi Industri

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Procedure for deformation detection using visual metrology by Ibrahim, Mohd. Sharuddin, Setan, Halim

“…Visual metrology are based on close range photogrammetry i.e. …”
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Two- and three-dimensional methods for inspection and metrology VI / by Huang, Peisen S., Society of Photo-Optical Instrumentation Engineers, Two- and three-dimensional methods for inspection and metrology (2008 : San Diego, California)

Traceability of metrology laboratory to ISO/IEC Guide 25 / by 265787 Azhar Safii

Enhancing calibration and standardisation via multifarious metrological programmes / by 364676 Sallehuddin Ibrahim, Abdul Wahab Ishari Mohd. Hashim, Institution of Engineers (Malaysia), Conference of Asean Federation of Engineering Organisations (14th : 1996 : Paradise Malacca Village Resort, Ayer Keroh, Malacca)