Diffraction-Based Overlay Metrology With Optical Convolution Layer by Jinyang Li, Hung-Fei Kuo

“…Currently, diffraction-based overlay (DBO) is widely adopted in overlay metrology. In response to existing challenges in DBO metrology, this study applied the concept of optical computing to establish a DBO metrology with an optical convolution layer that can predict the overlay of a DBO target, thereby providing a promising measurement method that increases the intuitiveness and efficiency of overlay metrology. …”
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Upstream installation effects on metrological characteristics of flow sensors by Eugenijus Maslauskas, Gediminas Zygmantas

“…The results of experimental investigation of upstream installation effects on metrological characteristics of the electromagnetic and turbine flow sensors of the nominal diameter DN50 are presented. …”
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National Metrology Infrastructure—Support for Analytical Laboratory Activity by Mirella Buzoianu

“…Starting from the role of a National Institute of Metrology (INM) in securing traceability of all measurements, regardless of their end-use or level of accuracy, some aspects related to the present state-of-art in the field of metrology in Romania are presented.…”
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Why and how to improve the subdivision technique in mass metrology by Z. Zelenka, S. Alisic, R. Hanrahan, I. Kolozinsky, G. Popa, J. Zůda, A. Malengo

“…Subdivision is an indispensable technique in mass metrology because it allows the determination of the mass of weights of various nominal values and the realisation of the mass scale.After the redefinition of the kilogram, this technique is becoming more important since the realisation of the kilogram now contributes a greater uncertainty than before. …”
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Hybrid Metal-Semiconductor Electron Pump for Quantum Metrology by X. Jehl, B. Voisin, T. Charron, P. Clapera, S. Ray, B. Roche, M. Sanquer, S. Djordjevic, L. Devoille, R. Wacquez, M. Vinet

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Recent Progress in Radon Metrology at IFIN-HH, Romania by Aurelian Luca, Ileana Rădulescu, Mihail-Răzvan Ioan, Viorel Fugaru, Constantin Teodorescu, Cătălina Barna, Cătălin Stelian Tuță, Cornel Liviu Tugulan, Andrei Antohe, Ioana Lalău, Cătălina Cîmpeanu, Cristian Postolache

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Preparation of metrological states in dipolar-interacting spin systems by Tian-Xing Zheng, Anran Li, Jude Rosen, Sisi Zhou, Martin Koppenhöfer, Ziqi Ma, Frederic T. Chong, Aashish A. Clerk, Liang Jiang, Peter C. Maurer

“…Abstract Spin systems are an attractive candidate for quantum-enhanced metrology. Here we develop a variational method to generate metrological states in small dipolar-interacting spin ensembles with limited qubit control. …”
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Detecting metrologically useful entanglement in the vicinity of Dicke states by Iagoba Apellaniz, Bernd Lücke, Jan Peise, Carsten Klempt, Géza Tóth

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Optimal approximate quantum error correction for quantum metrology by Sisi Zhou, Liang Jiang

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Typicality of Heisenberg scaling precision in multimode quantum metrology by Giovanni Gramegna, Danilo Triggiani, Paolo Facchi, Frank A. Narducci, Vincenzo Tamma

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Metrological aspects of expert evaluation of medicinal products’ quality by A. A. Turundaeva, Yu. V. Olefir, A. I. Lutseva, N. N. Gromova, E. A. Mamashina

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The Well-Dressed Spacecraft: Textiles for Cosmic Dust Metrology by Cherston, Juliana Mae

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Laser speckle modeling for three-dimensional metrology and LADAR by Dunmeyer, David Richard, 1978-

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Metrology of SIMOX buried oxide and nitride/STI CMP by Yoon, Jung Uk, 1971-

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Analysis and comparison of metrology methods for quantifying micro-endmills by Doyle, Jennifer Ariel

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Magnetoresistance metrology of skyrmion hosting multilayer thin films by Lew, Lincoln Wai Cheong

“…In this magnetoresistance metrology study, the main goal is to establish the detection of room temperature skyrmions at low current, so that skyrmions stays fixed, with an effectively and reliable method. …”
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Metrology, calibration, integration and testing of the WEAVE fibre positioner by Schallig, E

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Indentation metrology of clamped, ultra-thin elastic sheets by Vella, D, Davidovitch, B

“…This approach highlights some of the dangers in the use of approximate formulae in the metrology of solid films, which can introduce large errors; we suggest how such errors may be avoided in performing experiments and analyzing the resulting data.…”

Final assembly, metrology, and testing of the WEAVE fibre positioner by Hughes, S, Schallig, E, Lewis, I, Dalton, G, Terrett, D, Abrams, DC, Trager, S, Brock, M, Bishop, G, Middleton, K, Bonifacio, P, Vallenari, A, Carrasco, E, Aguerri, A

“…We provide an overview of the final assembly and metrology of the fibre positioner, and results of lab commissioning of its robot gantries. …”

Absolute distance metrology using frequency swept lasers by Warden, M