Joint estimation of phase and phase diffusion for quantum metrology. by Vidrighin, MD, Donati, G, Genoni, MG, Jin, X, Kolthammer, W, Kim, MS, Datta, A, Barbieri, M, Walmsley, I

“…Phase estimation, at the heart of many quantum metrology and communication schemes, can be strongly affected by noise, whose amplitude may not be known, or might be subject to drift. …”

Metrology at nanoscale: thermal wave probe made it simple by Abd. Moksin, Mohd Maarof

“…Parts of the problems include sample mounting, making contact with the sample; the possibility that the act of measuring alters the sample, repeatability and accuracy of measurement and referencing reference metrology to calibrate various tools to perform required measurements. …”
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IQK 202-3 - METROLOGI OKT-NOV 1993. by PPTI, Pusat Pengajian Teknologi Industri

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IQK 212/3 - METROLOGI SEPT-OKT 1997. by PPTI, Pusat Pengajian Teknologi Industri

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IQK 212-3 - METROLOGI SEPT OKT 1997 by PPTI, Pusat Pengajian Teknologi Industri

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ZSE 365 - METROLOGI I OKT-NOV 1995. by PPSF, Pusat Pengajian Sains Fizik

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IQK 202/3 - METROLOGI OKT-NOV 1990. by PPTI, Pusat Pengajian Teknologi Industri

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IQK 202/3 - METROLOGI OKT-NOV 1991. by PPTI, Pusat Pengajian Teknologi Industri

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IQK 202/3 - METROLOGI OKT-NOV 1992. by PPTI, Pusat Pengajian Teknologi Industri

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Results of the Activities of the Ministry of Economic Development and Trade in the Field of Technical Regulation, Standardization, Metrology and Metrology Activities for 2018 and the Main Tasks to be Completed By the End of 2019 by L. Vitkin

“…Results of the Activities of the Ministry of Economic Development and Trade in the Field of Technical Regulation, Standardization, Metrology and Metrology Activities for 2018 and the Main Tasks to be Completed By the End of 2019…”
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Calibration of Measuring Equipment in Accordance with the Requirements of the Law of Ukraine «On Metrology And Metrological Activity» and its Importance for Obtaining Comparable and Traceable Measurement Results, Their International Recognition by Yu. Kuzmenko, S. Cherepkov, I. Pototskyy, L. Nesvidomina, N. Milkovska

Subjects: “…metrological activities, measuring instruments, standards, calibration, metrological traceability…”
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Metrology investigation on a computer control multicoordinate measuring machine / by Beyer, Wolfgang

Analysis of the melting layer from metrological radar data in Malaysia / by Nor Hisham Hj Khamis, author, Omer Abdel Razag Sharif, author, Zakaria Hanzaz, author, Ameruddin, author, International confference on robotics vision , Intformation and signal processing (2007 : Pulau Pinang)i

Tasks and equipment of a laboratory for "machine elements" (industrial metrology) / by 271859 Beyer, W.

Handbook of 3D machine vision : optical metrology and imaging / by Song, Zhang

Traceability of metrology laboratory to ISO/IEC guide 25 ... [microfilm] by 265787 Azhar Safii, Kamalrolzaman Husain, Mohamad Asri Sharani, Naili Rohmanu Hamedon, Nor Azhar Ahmad, Zarismail Abdul Rahman

Optimal networks for quantum metrology: semidefinite programs and product rules by Giulio Chiribella

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Metrology for Indoor Radon Measurements and Requirements for Different Types of Devices by Andrey Tsapalov, Konstantin Kovler

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SELECTED METROLOGY PROBLEMS IMPLIED BY THE APPLICATION OF LED TECHNOLOGY IN LIGHTING by Urszula Błaszczak, Andrzej Stanisław Zając

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Optical metrology embraces deep learning: keeping an open mind by Bing Pan

“…Abstract Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.…”
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