Showing 381 - 400 results of 7,700 for search '"Metrology"', query time: 0.14s Refine Results
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    Optimal adaptive control for quantum metrology with time-dependent Hamiltonians by Shengshi Pang, Andrew N. Jordan

    Published 2017-03-01
    “…Quantum metrology investigates the improvement given to precision measurements by exploiting quantum mechanics, but it has been mostly limited to systems with static Hamiltonians. …”
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    Article
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    Metrological Complex for Verification and Calibration Optoelectronic Devices, Sensitive in the Infrared by B. Shabashkevich, Yu. Dobrovolsky, V. Yuriev

    Published 2019-03-01
    Subjects: “…metrological equipment, measurement, energy illumination, measurement errors.…”
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    Restoring Heisenberg scaling in noisy quantum metrology by monitoring the environment by Francesco Albarelli, Matteo A. C. Rossi, Dario Tamascelli, Marco G. Genoni

    Published 2018-12-01
    “…We finally describe in detail the stable and compact numerical algorithm that we have developed in order to evaluate the precision of such time-continuous estimation strategies, and that may find application in other quantum metrology schemes.…”
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    Metrological Traceability of Measurements Results for Gas Mixtures Components Content by M. Rozhnov, D. Melnyk, O. Levbarg

    Published 2017-12-01
    Subjects: “…gas mixture, mole fraction, verification scheme, reference materials, measurement standards, gravimetric preparation, metrological traceability…”
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    Impacts of Rooftop Photovoltaics on the Urban Thermal Microclimate: Metrological Investigations by Elisabeth Fassbender, Simon Pytlik, Josef Rott, Claudia Hemmerle

    Published 2023-09-01
    “…The data required for the comparative analyses are gathered through metrological investigations of two rooftops with and without PVs in Munich, Germany. …”
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    OBSERVATIONS ON THE PERFORMANCE OF X-RAY COMPUTED TOMOGRAPHY FOR DIMENSIONAL METROLOGY by H. C. Corcoran, H. C. Corcoran, S. B. Brown, S. Robson, R. D. Speller, M. B. McCarthy

    Published 2016-06-01
    “…X-ray computed tomography (XCT) is a rising technology within many industries and sectors with a demand for dimensional metrology, defect, void analysis and reverse engineering. …”
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    METROLOGICAL MODELING AS A BASIS OF MEASUREMENT TECHNIQUE DESIGN AND IMPLEMENTATION by S. S. Sokolovsky, D. V. Solomakho, B. V. Tsitovitch

    Published 2015-04-01
    “…The article describes the use of modeling in measurements and control, which can be regarded as “metrological modeling” of the measurement objects, measuring process and measuring techniques in general. …”
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    Development of a stand for measuring metrological characteristics of electric motors by Володимир Павлович Квасніков, Дмитро Михайлович Квашук, Марія Олександрівна Катаєва

    Published 2021-08-01
    “…For this purpose, a stand was developed for measuring the metrological characteristics of electric motors. It was tested in conditions of increased vibration. …”
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