Metrological Approach for the Quantification of Metalloproteins (EMRP Project HLT05) by Swart Claudia, Zakel Sabine, Frank Claudia, Fisicaro Paola, Goenaga-Infante Heidi

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An interface protection system based on an embedded metrology system platform by Giovanni Artale, Giuseppe Caravello, Antonio Cataliotti, Valentina Cosentino, Dario Di Cara, Salvatore Guaiana, Nicola Panzavecchia, Giovanni Tinè

“…Moreover, it has also an integrated metrology section. Experimental tests will show how this last feature allows a significant reduction of the measurement data access time allowing an improvement of trip time accuracy.…”
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Characterization of NIS neutron irradiation facility for calibration and metrological application by El-Sersy Ahmed R., Sayed Eman A., Nagib Salwa H., Bakr Reham Hamdy, Mahmoud Randa M.M.

“…International Journal of Metrology and Quality Engineering…”
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Two-Photon Polymerization Metrology: Characterization Methods of Mechanisms and Microstructures by Christopher N. LaFratta, Tommaso Baldacchini

“…Furthermore, we will discuss potential opportunities for using optofluidics and lab-on-a-chip systems for TPP metrology.…”
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Methodology to Evaluate the Performance of Portable Photogrammetry for Large-Volume Metrology by Pablo Puerto, Daniel Heißelmann, Simon Müller, Alberto Mendikute

Subjects: “…large-volume metrology (LVM)…”
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Smart revolution and metrology: A longitudinal science mapping approach by M.C. Sousa, M.F.L. Almeida

Subjects: “…Metrology…”
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A review of metrology in lithium-ion electrode coating processes by Carl D. Reynolds, Peter R. Slater, Sam D. Hare, Mark J.H. Simmons, Emma Kendrick

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Future Challenges and Critical Approach to Metrology in Patients with Axial Spondyloarthritis by Juan L. Garrido-Castro, Eduardo Collantes-Estévez, Francisco Alburquerque-Sendín, Clementina López-Medina

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Microsphere-assisted, nanospot, non-destructive metrology for semiconductor devices by Soonyang Kwon, Jangryul Park, Kwangrak Kim, Yunje Cho, Myungjun Lee

“…Thus, owing to its ultra-small spot metrology capability, this technique has great potential for solving the current metrology challenge of monitoring in-cell CD variations in advanced logic and memory devices.…”
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EURAMET EMN-Q: The European metrology network for quantum technologies by Ivo Pietro Degiovanni, Marco Gramegna, Sébastien Bize, Hansjörg Scherer, Christopher Chunnilall

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Research Update: Electron beam-based metrology after CMOS by J. A. Liddle, B. D. Hoskins, A. E. Vladár, J. S. Villarrubia

“…The magnitudes of the challenges facing electron-based metrology for post-CMOS technology are reviewed. Directed self-assembly, nanophotonics/plasmonics, and resistive switches and selectors are examined as exemplars of important post-CMOS technologies. …”
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Intercomparisons as an important element of quality assurance in metrology of ionising radiation by Živanović Miloš Z., Lazarević Đorđe R., Ciraj-Bjelac Olivera F., Stanković Srboljub J., Ćeklić Sandra M., Karadžić Katarina S.

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A Secure System Architecture for Measuring Instruments in Legal Metrology by Daniel Peters, Michael Peter, Jean-Pierre Seifert, Florian Thiel

Subjects: “…legal metrology…”
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Optimal and Variational Multiparameter Quantum Metrology and Vector-Field Sensing by Raphael Kaubruegger, Athreya Shankar, Denis V. Vasilyev, Peter Zoller

“…Our results on optimal and variational multiparameter quantum metrology are useful for advancing precision measurements in fundamental science and ensuring the stability of quantum computers, which can be achieved through the incorporation of optimal quantum sensors in a quantum feedback loop.…”
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Dynamical decoupling leads to improved scaling in noisy quantum metrology by Pavel Sekatski, Michalis Skotiniotis, Wolfgang Dür

Subjects: “…quantum metrology…”
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Shortcut-to-Adiabaticity-Like Techniques for Parameter Estimation in Quantum Metrology by Marina Cabedo-Olaya, Juan Gonzalo Muga, Sofía Martínez-Garaot

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Metrology of Systems of Evolutionary Coordination of Decisions and Rationing of Intellectual Work by Zinaida Potapova, Vladislav Protasov

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Bose–Einstein condensate soliton qubit states for metrological applications by The Vinh Ngo, Dmitriy V. Tsarev, Ray-Kuang Lee, Alexander P. Alodjants

“…Abstract We propose a novel platform for quantum metrology based on qubit states of two Bose–Einstein condensate solitons, optically manipulated, trapped in a double-well potential, and coupled through nonlinear Josephson effect. …”
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Evading noise in multiparameter quantum metrology with indefinite causal order by Aaron Z. Goldberg, Khabat Heshami, L. L. Sánchez-Soto

“…Moreover, increasing the dimension of the control system increases the number of simultaneously estimable parameters, which has important metrological ramifications. We demonstrate this capability for simultaneously estimating both unitary and noise parameters, including multiple parameters from the same unitary such as rotation angles and axes and from noise channels such as depolarization, dephasing, and amplitude damping in arbitrary dimensions. …”
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Smart specialisation concept in metrology for blood and intraocular pressure measurements by Václav Sedlák, Dominik Pražák, Markus Schiebl, Michał Nawotka, Ehlimana Jugo, Maria do Céu Ferreira, Alan Duffy, Dana Maria Rosu, Peter Pavlásek, Gregor Geršak

Subjects: “…Medical metrology…”
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