EPM 212 – METROLOGY AND QUALITY CONTROL Duration : 2 hours by Mekanik, Pusat Pengajian Kejuruteraan

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Analysis of the melting layer from metrological radar data in Malaysia by Khamis, Nor Hisham, Razag Sharif, Omer Abdel, Hanzaz, Zakaria, Baharom, Ameruddin

Performance-based gear metrology : kinematic-transmission-error computation and diagnosis / by 350526 Mark, William D.

Metrological Qualification of PD Analysers for Insulation Diagnosis of HVDC and HVAC Grids by Fernando Garnacho, Fernando Álvarez, Alf-Peter Elg, Christian Mier, Kari Lahti, Abderrahim Khamlichi, Eduardo Arcones, Joni Klüss, Armando Rodrigo Mor, Pertti Pakonen, José Ramón Vidal, Álvaro Camuñas, Jorge Rovira, Carlos Vera, Miran Haider

“…To ensure the required performances, a metrological qualification of the PD analysers by applying an evaluation procedure is necessary. …”
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Author Correction: Metrological complementarity reveals the Einstein-Podolsky-Rosen paradox by Benjamin Yadin, Matteo Fadel, Manuel Gessner

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Applied Fourier Programming for metrological control of printing materials of packaging products by Артем Олегович Карачевцев, Михайло Петрович Горський, Клавдія Юріївна Зенкова, Вікторія Валеріївна Морфлюк-Щур, Олександр Володимирович Дуболазов, Лілія Станіславівна Слоцька, Андрій Ярославович Довгунь, Едгар Вадимович Ватаманіца

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Microwave Field Metrology Based on Rydberg States of Alkali-Metal Atoms by Vitaly D. Ovsiannikov, Vitaly G. Palchikov, Igor L. Glukhov

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Combined Non-Invasive Optical Oximeter and Flowmeter with Basic Metrological Equipment by Andrey Tarasov, Denis Lapitan, Dmitry Rogatkin

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“Metrology” Approach to Data Streams Initiated by Internet Services in the Local Networks by Nina A. Filimonova, Alexander G. Kolpakov, Sergei I. Rakin

“…On this basis, it is possible to develop an analog of the classical metrology approach for the data streams generated by Internet services. …”
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Development of sensitive measuring circuits for measurement of physicochemical parameters and their metrological characteristics by Masharipov Sh. M., Kudratov J. Kh.

“…A scientifically based increase in the reliability of the results of chemical analysis and physicochemical measurements, the identification and minimization of their errors are impossible without the use of the foundations of metrology - the science of measurements. At the same time, theoretical metrology is rather closely intertwined with the legislative - a set of state acts and regulatory documents that regulate the rules, requirements and norms that must be guided by when making measurements. …”
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Metrology Challenges in 3D NAND Flash Technical Development and Manufacturing by Wei Zhang, Jun Xu, Sicong Wang, Yi Zhou, Jian Mi

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Metrological studies of the characteristics of multilayer surface coatings using synchrotron radiation by A. S. Sigov, O. A. Minaeva, S. I. Anevsky, A. M. Lebedev, R. V. Minaev

“…It plays an important role in nanoelectronics metrological base. The main research were carried out at electron storage rings «Siberia-1» (Kurchatov Institute) and MLS (PTB, Berlin) with low electron energy, in a wide wavelength range, including visible range, AUV, VU, EUV and to exclude the X-ray radiation influence. …”
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Kinematic viscosity of liquid media and providing metrological observability of experimental results by Masharipov Shodlik M., Rakhmatullaev Sarvar A.

“…The subject of this study is to explore modern methods for control of dynamic and kinematic viscosity of liquid media, the state of its metrological support in the republic as well as to see findings from the experiments to ensure metrological control in the International System of Units. …”
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Application of numerical modelling in stream metrology on the example of primary air installation by Kabaciński Mirosław, Pospolita Janusz, Polak Janusz, Adamus Piotr, Salij Antoni, Sumara Kazimierz

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Quantum advantage of time-reversed ancilla-based metrology of absorption parameters by Jiaxuan Wang, Ruynet L. de Matos Filho, Girish S. Agarwal, Luiz Davidovich

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In-Situ Metrology of Large Segmented Detector Based on Modified Optical Truss by Qichang An, Hanfu Zhang, Xiaoxia Wu, Jianli Wang, Tao Chen, Jingxu Zhang, Hongwen Li

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Heisenberg-limited single-mode quantum metrology in a superconducting circuit by W. Wang, Y. Wu, Y. Ma, W. Cai, L. Hu, X. Mu, Y. Xu, Zi-Jie Chen, H. Wang, Y. P. Song, H. Yuan, C.-L. Zou, L.-M. Duan, L. Sun

“…Reaching a quantum advantage in metrology usually requires hard-to-prepare two-mode entangled states such as NOON states. …”
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Metrological Evaluation of a Novel Medical Robot and Its Kinematic Calibration by Longfei Zhao, Ahmed Joubair, Pascal Bigras, Ilian A. Bonev

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Data Analytics for Noise Reduction in Optical Metrology of Reflective Planar Surfaces by Cody Berry, Marcos S. G. Tsuzuki, Ahmad Barari

Subjects: “…coordinate metrology…”
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Coherent population trapping with a controlled dissipation: applications in optical metrology by L Nicolas, T Delord, P Jamonneau, R Coto, J Maze, V Jacques, G Hétet

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