Laser Metrology of Anisotropic Polymer Layers Structure of Materials for Packaging Industry by Михайло Петрович Горський, Христина Вікторівна Фельде, Клавдія Юріївна Зенкова, Вікторія Валеріївна Морфлюк-Щур, Олександр Володимирович Дуболазов, Лілія Станіславівна Слоцька, Оксана Мирославівна Яцько, Олександр Вікторович Галочкін, Мирослав Любомирович Ковальчук, Олександр Павлович Шостачук

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Essential Ocean Variables for Marine Environment Monitoring: Metrological Case Studies by Francesca Rolle, Francesca Romana Pennecchi, Francesca Durbiano, Stefano Pavarelli, Chiara Musacchio, Graziano Coppa, Andrea Merlone, Michela Sega

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Developing definitions of conventional hardness tests for use by National Metrology Institutes by S. Low, A. Germak, A. Knott, R. Machado, J. Song

“…This paper describes the process used by the Consultative Committee for Mass and Related Quantities - Working Group on Hardness (CCM-WGH) of the International Committee of Weights and Measures (CIPM) to develop international definitions of the conventional Rockwell, Brinell, Vickers and Knoop hardness test methods, for use by the National Metrology Institutes (NMI) that standardize hardness measurement.…”
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Soft-Sensing Regression Model: From Sensor to Wafer Metrology Forecasting by Angzhi Fan, Yu Huang, Fei Xu, Sthitie Bom

“…Effective inspection and metrology are necessary to improve product yield, increase product quality and reduce costs. …”
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INDEXES TO EVALUATE RISK BASED METROLOGICAL PERFORMANCE IN COMPANIES IN THE ENERGY SECTOR by Aníbal Barrera García, Michael Feitó Cespón, Roberto Cespón Castro

Subjects: “…metrological performance…”
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Transport of Heat and Charge in Electromagnetic Metrology Based on Nonequilibrium Statistical Mechanics by James Baker-Jarvis, Jack Surek

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METROLOGICAL MODELING OF DIMENSIONAL OPERATIONAL INSPECTION PROCESSES AS AN INSTRUMENT OF RELIABILITY ASSURANCE by D. V. Solomakho

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A Human as a Research Object for Metrology of Nonlinear Dynamic Systems by Yu. Machekhin, Yu. Kurskoy, H. Prisich

Subjects: “…Metrology of Nonlinear Dynamic Systems, Measurement Model, Fractal Dimension, Shannon Entropy…”
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Metrology for radiation protection: a new European network in the foundation phase by A. Röttger, A. Veres, V. Sochor, M. Pinto, M. Derlacinski, M.-R. Ioan, A. Sabeta, R. Bernat, C. Adam-Guillermin, J. H. Gracia Alves, D. Glavič-Cindro, S. Bell, B. Wens, L. Persson, M. Živanović, R. Nylund

“…Furthermore, long-term knowledge sharing, and capacity building will be supported and a proposal for a sustainable joint European metrology infrastructure is under way. This will significantly strengthen the radiation protection metrology and support radiation protection measures. …”
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Metrological Properties Analysis of Portable Dc Voltage Calibrator with Errors Correction by V. Yatsuk, R. Matviiv, Yu. Yatsuk

“…A comparison of the dynamic and metrological characteristics of DC voltage calibrators with single- and two-period demodulation has been carried out and operator and time mathematical models have been proposed (Figure 2). …”
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Report of the CCU/CCQM Workshop on “The Metrology of Quantities Which Can Be Counted” by Richard J. C. Brown, Bernd Güttler, Pavel Neyezhmakov, Michael Stock, Robert I. Wielgosz, Stefan Kück, Konstantina Vasilatou

Subjects: “…metrology…”
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Dose metrology: TLD/OSL dose accuracy and energy response performance by Omaima Essaad Belhaj, Hamid Boukhal, El Mahjoub Chakir, Meryeme Bellahsaouia, Siham Belhaj, Younes Sadeq, Mohammed Tazi, Tahar El Khoukhi, Maryam Hadouachi, Khaoula Laazouzi

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Metrological and Critical Characterization of the Intel D415 Stereo Depth Camera by Monica Carfagni, Rocco Furferi, Lapo Governi, Chiara Santarelli, Michaela Servi, Francesca Uccheddu, Yary Volpe

“…Given the unexplored potential of this new device, especially when used as a 3D scanner, the present work aims to characterize and to provide metrological considerations for the RealSense D415. In particular, tests are carried out to assess the device performance in the near range (i.e., 100⁻1000 mm). …”
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System-Information Base of Metrological Support of Technical and Economic Parameters of Production by І. Ruzhentsev, S. Lutsky, V. Fetkіv

Subjects: “…system-information base, discrete likely logarithmic index, metrological support…”
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The Evaluation of the Metrological Assurance of of High-Voltage Direct Current Measuring State by O. Velychko, R. Vendychanskiy

Subjects: “…expert estimation; metrological assurance; measurement; high-voltage of direct current…”
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VALIDATION OF THE METROLOGICAL MODEL OF COORDINATE MEASURING ARM USING MULTIFEATURE CHECK by Kamila Gromczak, Ksenia Ostrowska, Danuta Owczarek, Jerzy Sładek

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APPROACH TO THE SUBSTANTIATION OF THE OPTION OF COMPOSITION OF THE METROLOGICAL OFFICE GROUPS IN CONSIDERING RISKS by Andrey S. Efremov, Sergei V. Puzankov

Subjects: “…metrological service…”

Performance study of dimensionality reduction methods for metrology of nonrigid mechanical parts by Radvar-Esfahlan H., Tahan S.-A.

“…International Journal of Metrology and Quality Engineering…”
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Characterizing a linear pyrometer at the National Metrology Institute of South Africa by Ejigu Efrem K.

“…International Journal of Metrology and Quality Engineering…”
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Cellular Metrology: Scoping for a Value Proposition in Extra- and Intracellular Measurements by Nilofar Faruqui, Andreas Kummrow, Boqiang Fu, Carla Divieto, Fabiola Rojas, Florence Kisulu, Janaina J. V. Cavalcante, Jing Wang, Jonathan Campbell, Juliana L. Martins, Jun-Hyuk Choi, Maria Paola Sassi, Massimo Zucco, Maxim Vonsky, Maxim Vonsky, Sandrine Vessillier, Shan Zou, Shin-Ichiro Fujii, Maxim G. Ryadnov

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