Showing 541 - 560 results of 7,700 for search '"Metrology"', query time: 0.31s Refine Results
  1. 541
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    Information and methodological support for intermediate checks of equipment and assessment of metrological characteristics by Masharipov Shodlik, Mustafayev Oybek, Oymirov Sunnat

    Published 2024-01-01
    “…Types and methods of measurements are the objects of consideration of theoretical and applied metrology and are selected in accordance with the specific measurement task.…”
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    Article
  3. 543
  4. 544

    Analysis of the Scale for Evaluating the Competence of Experts on Metrology Using the Rusch Model by O. Velychko, T. Gordiyenko

    Published 2018-03-01
    “…The article presents the results of the study of known scales for assessing the competence of experts in metrology using of the Rasсh model. The main features of constructing mathematical Rasсh model are presented. …”
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    Article
  5. 545

    Quantum-coherence-free precision metrology by means of difference-signal amplification by Jialin Li, Yazhi Niu, Xinyi Wang, Lupei Qin, Xin-Qi Li

    Published 2023-03-01
    “…Abstract The novel weak-value-amplification (WVA) scheme of precision metrology is deeply rooted in the quantum nature of destructive interference between the pre- and post-selection states. …”
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    Article
  6. 546
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  8. 548

    The power of microscopic nonclassical states to amplify the precision of macroscopic optical metrology by Wenchao Ge, Kurt Jacobs, M. Suhail Zubairy

    Published 2023-01-01
    “…In the context of quantifying nonclassicality, the amount by which a nonclassical state can enhance precision in this way has been termed its ’metrological power’. To-date, the enhancement provided by weak nonclassical states has been calculated only for specific measurement configurations. …”
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  11. 551

    Nanopowder metrology and nanoparticle size measurement - Towards the development and testing of protocols by Anne Aimable, Paul Bowen

    Published 2010-09-01
    “…A series of protocols for nanosized powders - nanopowder metrology - was produced within the framework of a COST Action - COST 539 “Electroceramics from Nanopowders Produced by Non-conventional Methods”. …”
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  12. 552

    Improving the measurement standard for the metrological support of the porometry of solid substances and materials by E. P. Sobina

    Published 2019-02-01
    “…This work considers the state of the metrology of porometry and presents the first results of studies on the metrological characteristics of reference systems implementing the methods of mercury porometry and stationary filtration. …”
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  13. 553
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    Operation of the Metrology Light Source as a primary radiation source standard by Roman Klein, Guido Brandt, Rolf Fliegauf, Arne Hoehl, Ralph Müller, Reiner Thornagel, Gerhard Ulm, Michael Abo-Bakr, Jörg Feikes, Michael v. Hartrott, Karsten Holldack, Godehard Wüstefeld

    Published 2008-11-01
    “…The Metrology Light Source (MLS), the new electron storage ring of the Physikalisch-Technische Bundesanstalt (PTB) located in Berlin, is dedicated to metrology and technological developments in the UV and extreme UV spectral range as well as in the IR and THz region. …”
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  15. 555
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    METROLOGICAL SUPPLY OF ELECTRONIC REGULATORS FOR GTE – STAND-IMITATOR OF ENGINE SENSORS by Анна Григорьевна Буряченко, Иван Константинович Лопащенко

    Published 2018-11-01
    “…The main attention is devoted to the control of the metrological characteristics of the regulator measuring channels. …”
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  17. 557

    Attosecond stable dispersion-free delay line for easy ultrafast metrology by Akansha Tyagi, Mehra S. Sidhu, Ankur Mandal, Sanjay Kapoor, Sunil Dahiya, Jan M. Rost, Thomas Pfeifer, Kamal P. Singh

    Published 2022-05-01
    “…Abstract We demonstrate a dispersion-free wavefront splitting attosecond resolved interferometric delay line for easy ultrafast metrology of broadband femtosecond pulses. Using a pair of knife-edge prisms, we symmetrically split and later recombine the two wavefronts with a few tens of attosecond resolution and stability and employ a single-pixel analysis of interference fringes with good contrast using a phone camera without any iris or nonlinear detector. …”
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  18. 558

    3D Metrology Using One Camera with Rotating Anamorphic Lenses by Xiaobo Chen, Jinkai Zhang, Juntong Xi

    Published 2022-11-01
    “…In this paper, a novel 3D metrology method using one camera with rotating anamorphic lenses is presented based on the characteristics of double optical centers for anamorphic imaging. …”
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  19. 559
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    Metrological Maintenance Developed for Refractometric Measurements Based on the Surface Plasmon Resonance by M. Khodakovskyy, M. Budnyk, T. Ryzhenko, T. Lebyedyeva

    Published 2017-11-01
    Subjects: “…metrological maintenance, refractometric measurements, surface plasmon resonance…”
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    Article