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    A new probabilistic model with mixed-state failure rates: Modeling time-to-event scenarios in reliability and music engineering

    A new probabilistic model with mixed-state failure rates: Modeling time-to-event scenarios in reliability and music engineering by Xiaochun Liu, Jian Ji, Afaf Alrashidi, Fatimah A. Almulhim, Etaf Alshawarbeh, Jin-Taek Seong

    Published 2024-06-01
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