Engineering and Analytical Method for Estimating the Parametric Reliability of Products by a Low Number of Tests by Alexey G. Amosov, Vladislav A. Golikov, Mikhail V. Kapitonov, Fedor V. Vasilyev, Oleg K. Rozhdestvensky

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Effectiveness of models of degradation of functional parameters for predicting the parametric reliability of semiconductor devices by S. M. Borovikov, N. I. Tsyrelchuk, S. S. Dick, E. N. Shneiderov

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The reliability evaluation of the water surface remote monitoring satellite equipment by A. D. Gubarev, I. L. Yaschuk, Ya. V. Khilinskaya

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Optimization and evaluation of the technical readiness of the selective laser melting for the manufacture of space technology components by E. N. Loskutov, Ia. V. Faida, A. D. Gubarev

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Theoretical basis of the concept for technical service of machines on actual state based on assessed parametric reliability by D. V. Varnakov, O. N. Didmanidze

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Forecasting reliability of ShADR-32M coolant flow rate sensors by A.I. Pereguda, V.I. Belozerov

Subjects: “…Parametric reliability…”
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