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High resolution x-ray characterization of Tl-2212 superconducting thin films
Published 2001“…High resolution strain measurements and diffraction topographic imaging studies were performed using the synchrotron at Stanford Synchrotron Radiation Laboratory (SSRL). From these results, we have reached preliminary conclusions regarding the effect of film strain and substrate twinning on the superconducting properties of Tl-2212 films on LAO substrates. …”
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Extracting the Dynamic Magnetic Contrast in Time-Resolved X-Ray Transmission Microscopy
Published 2019-06-01Get full text
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