Titanium and Ruthenium Phthalocyanines for NO2 Sensors: A Mini-Review by Valerio Rossi Albertini, Barbara Paci, Amanda Generosi, Gentilina Rossi, Giovanna Pennesi, Anna Maria Paoletti

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X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper by Oleg V. Konovalov, Valentina Belova, Francesco La Porta, Mehdi Saedi, Irene M. N. Groot, Gilles Renaud, Irina Snigireva, Anatoly Snigirev, Maria Voevodina, Chen Shen, Andrea Sartori, Bridget M. Murphy, Maciej Jankowski

Subjects: “…x-ray reflectivity…”
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Nanoscale Structure of Langmuir–Blodgett Film of Bent-Core Molecules by Fabrizio Corrado Adamo, Federica Ciuchi, Maria Penelope De Santo, Paola Astolfi, Isabelle Warner, Eric Scharrer, Michela Pisani, Francesco Vita, Oriano Francescangeli

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Polarization Analysis in Mössbauer Reflectometry with Synchrotron Mössbauer Source by Marina Andreeva, Roman Baulin, Aleksandr Chumakov, Tatiyana Kiseleva, Rudolf Rüffer

Subjects: “…X-ray reflectivity…”
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Reflection optimization of nano-multilayer X-ray mirrors in three-edge energies: Cr-Kα, Co-Kα, and Ti-Kα by H Ghavidel, H Khosroabadi, M Otoukesh

Subjects: “…X-ray reflectivity…”
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Graphene at Liquid Copper Catalysts: Atomic‐Scale Agreement of Experimental and First‐Principles Adsorption Height by Hao Gao, Valentina Belova, Francesco La Porta, Juan Santiago Cingolani, Mie Andersen, Mehdi Saedi, Oleg V. Konovalov, Maciej Jankowski, Hendrik H. Heenen, Irene M. N. Groot, Gilles Renaud, Karsten Reuter

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Adsorption and Microstructure of Core-Shell Nanoparticles at Liquid-Liquid Interfaces: An X-ray Reflectivity Study by Lucio Isa

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Analysis of Resonant Soft X-ray Reflectivity of Anisotropic Layered Materials by Luca Pasquali, Nicola Mahne, Angelo Giglia, Adriano Verna, Lorenzo Sponza, Raffaella Capelli, Matteo Bonfatti, Francesco Mezzadri, Emanuele Galligani, Stefano Nannarone

Subjects: “…soft X-ray reflectivity…”
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Research progress on the structure of hydration films at solid–liquid interfaces by Na ZHANG, Jue KOU, Chunbao SUN

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X-Ray Calc: A software for the simulation of X-ray reflectivity by Oleksiy V. Penkov, Igor A. Kopylets, Mahdi Khadem, Tianzuo Qin

Subjects: “…X-ray reflectivity…”
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Structure and morphology of adsorbed protein (BSA) layer on hydrophilic silicon surface in presence of mono-, di- and tri-valent ions by Sanu Sarkar, Sarathi Kundu

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Study of the Correlation between the Amorphous Indium-Gallium-Zinc Oxide Film Quality and the Thin-Film Transistor Performance by Shiben Hu, Kuankuan Lu, Honglong Ning, Rihui Yao, Yanfen Gong, Zhangxu Pan, Chan Guo, Jiantai Wang, Chao Pang, Zheng Gong, Junbiao Peng

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Parameter estimation for X-ray scattering analysis with Hamiltonian Markov Chain Monte Carlo by Zhang Jiang, Jin Wang, Matthew V. Tirrell, Juan J. de Pablo, Wei Chen

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Features of the two-stage formation of macroporous and mesoporous silicon structuresя by Alexander S. Lenshin, Anatoly N. Lukin, Yaroslav A. Peshkov, Sergey V. Kannykin, Boris L. Agapov, Pavel V. Seredin, Evelina P. Domashevskaya

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Insights into Chemical Interactions and Related Toxicities of Deep Eutectic Solvents with Mammalian Cells Observed Using Synchrotron Macro–ATR–FTIR Microspectroscopy by Saffron J. Bryant, Zo L. Shaw, Louisa Z. Y. Huang, Aaron Elbourne, Amanda N. Abraham, Jitraporn Vongsvivut, Stephen A. Holt, Tamar L. Greaves, Gary Bryant

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Sc/SiC/Al Multilayer Optimization for Li K Spectroscopy by Khalil Hassebi, Evgueni Meltchakov, Franck Delmotte, Angelo Giglia, Philippe Jonnard

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Extending resonant inelastic X-ray scattering to the extreme ultraviolet by L. Andrew eWray, Shih-Wen eHuang, Ignace eJarrige, Kazuhiko eIkeuchi, Kenji eIshii, Jia eLi, Z. Q. eQiu, Zahid eHussain, Yi-De eChuang

Subjects: “…X-ray reflectivity…”
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Multilayer Density Analysis of Cellulose Thin Films by Carina Sampl, Carina Sampl, Katrin Niegelhell, Katrin Niegelhell, David Reishofer, Roland Resel, Stefan Spirk, Stefan Spirk, Ulrich Hirn, Ulrich Hirn

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Study of interface reaction in a B4C/Cr mirror at elevated temperature using soft X-ray reflectivity by Mohammed H. Modi, Shruti Gupta, Praveen K. Yadav, Rajkumar Gupta, Aniruddha Bose, Chandrachur Mukherjee, Philippe Jonnard, Mourad Idir

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Investigation of wet etching technique for selective patterning of ferroelectric zirconium-doped hafnium oxide thin films for high-frequency electronic applications by Livia Alexandra Dinu, Cosmin Romanitan, Martino Aldrigo, Catalin Parvulescu, Florin Nastase, Silviu Vulpe, Raluca Gavrila, Pericle Varasteanu, Andreea Bianca Serban, Rihem Noumi, Olga M. Ishchenko

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