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    Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-ray Transparent Samples

    Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-ray Transparent Samples by Sina Mayr, Simone Finizio, Joakim Reuteler, Stefan Stutz, Carsten Dubs, Markus Weigand, Aleš Hrabec, Jörg Raabe, Sebastian Wintz

    Published 2021-05-01
    Subjects: “…Xe plasma focused ion beam…”
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