Showing 1 - 20 results of 1,835 for search '"atomic force microscope"', query time: 1.24s Refine Results
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    Atomic Force Microscope: Modeling, Simulations, and Experiments by El Rifai, Osamah M., Youcef-Toumi, Kamal

    Published 2003
    “…The quality of atomic force microscope (AFM) data strongly depends on scan and controller parameters. …”
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    Article
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    The Method of Correction Hysteresis Piezoscanner Atomic Force Microscope by Salem A.A. Mohammed, Galina D. Melnikova, Aleksandr A. Makhaniok, Sergey A. Chizhik, Natalya S. Kyzhel

    Published 2015-09-01
    “…The method of correcting software hysteresis piezoscanner atomic force microscope was proposed. The algorithm for correction was used for the samples of silicon, mica, polysulfone, and human erythrocytes, and platelets. …”
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    The atomic force microscope as a mechano–electrochemical pen by Christian Obermair, Andreas Wagner, Thomas Schimmel

    Published 2011-10-01
    “…We demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM) as a “mechano–electrochemical pen”. …”
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    Article
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    Quantifying droplet–solid friction using an atomic force microscope by Xue Qi Koh, Calvin Thenarianto, Ville Jokinen, Dan Daniel

    Published 2024-04-01
    “…Here, we attach a micrometric‐sized droplet to an atomic force microscope cantilever to directly quantify droplet–solid friction on different surfaces (superhydrophobic and underwater superoleophobic) with sub‐nanonewton force resolutions. …”
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    In situ Imaging of Single Polyelectrolyte Chains with the Atomic Force Microscope by Svilen Kozhuharov, Plinio Maroni, Michal Borkovec

    Published 2019-02-01
    “… Abstract: This article discusses the possibilities offered by modern atomic force microscopes (AFMs) with ultra-small cantilevers to perform in situ imaging of single adsorbed polyelectrolytes in aqueous solutions. …”
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    AFM (Atomic force microscope) and its use in studying the surface by Škvarla Jiří

    Published 1996-06-01
    Subjects: “…Atomic force microscope (AFM)…”
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    Tip-Jump Response of an Amplitude-Modulated Atomic Force Microscope by Po-Jen Shih

    Published 2012-05-01
    “…The dynamic behaviors of an Atomic Force Microscope are of interest, and variously unpredictable phenomena are experimentally measured. …”
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